Record link: 
http://hdl.handle.net/20.500.12708/221186
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Title: 
Thickness and Elemental Quantification of (Ultra)Thin Films Revisited
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Citation: 
Sauer, M., Rath, J., Foelske, A., & Ingerle, D. (2025). Thickness and Elemental Quantification of (Ultra)Thin Films Revisited. In AVS Quantum Science Workshop : Abstract Book (pp. 178–178).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Sauer, Markus 
Rath, Jakob 
Foelske, Annette 
Ingerle, Dieter 
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Organisational Unit: 
E057-05 - Fachbereich Analytical Instrumentation Center 
E057-04 - Fachbereich Röntgenzentrum 
E141-05 - Forschungsbereich Radiation Physics 
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials 
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Published in: 
AVS Quantum Science Workshop : Abstract Book 
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Date (published): 
Sep-2025
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Event name: 
AVS 71 International Symposium and Exhibition 2025 
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Event date: 
22-Sep-2025 - 25-Sep-2025
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Event place: 
Charlotte, United States of America (the)
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Number of Pages: 
1
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Keywords: 
Thin films; Thickness determination; Surface analytics
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Research facilities: 
Analytical Instrumentation Center 
Röntgenzentrum 
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Project title: 
Elektrochemischer Oberflächen- und Grenzflächen- Analytik Cluster: 884672 (FFG - Österr. Forschungsförderungs- gesellschaft mbH) 
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Additional information: 
https://avs71.avs.org/
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Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 50%
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Science Branch: 
1040 - Chemie: 60%
1030 - Physik, Astronomie: 40%
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Appears in Collections:
Conference Paper

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