Record link: 
http://hdl.handle.net/20.500.12708/223326
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Title: 
Scanning Probe Microscopy
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Citation: 
Franceschi, G., Riva, M., Schmid, M., & Diebold, U. (2025). Scanning Probe Microscopy. In S. A. Chambers (Ed.), Handbook of Molecular Beam Epitaxy of Oxide Materials : Volume 2: Materials Characterization Methods for Epitaxial Films and Heterostructures (pp. 443–537). World Scientific Publishing. https://doi.org/10.1142/9789819805631_0007
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Publisher DOI: 
10.1142/9789819805631_0007
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Publication Type: 
Book Contribution - Edited Volume Contribution
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Language: 
English
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Authors: 
Franceschi, Giada 
Riva, Michele 
Schmid, Michael 
Diebold, Ulrike 
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Organisational Unit: 
E134-05 - Forschungsbereich Surface Physics 
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials 
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Published in: 
Handbook of Molecular Beam Epitaxy of Oxide Materials : Volume 2: Materials Characterization Methods for Epitaxial Films and Heterostructures 
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DOI of the book: 
10.1142/14109-vol2
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Date (published): 
2025
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Number of Pages: 
95
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Publisher: 
World Scientific Publishing
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Keywords: 
Surface Physics
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Abstract: 
This chapter discusses the applicability of STM within highly controlled thin-film studies. We chose to focus on STM because it is much more widely spread as compared to other techniques that can provide direct atomic-scale information on growth processes and because this technique fits our own expertise. The chapter is intended for non-STM experts.
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Research Areas: 
Surfaces and Interfaces: 100%
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Science Branch: 
1030 - Physik, Astronomie: 100%
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Appears in Collections:
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