Record link: 
http://hdl.handle.net/20.500.12708/225038
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Title: 
Unveiling Defects at the Semiconductor/Oxide Interface: A Multiscale Modeling Approach
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Citation: 
Waldhör, D. (2025, October). Unveiling Defects at the Semiconductor/Oxide Interface: A Multiscale Modeling Approach [Conference Presentation]. CAS Frontiers in Science (CASFIS) Symposium, Beijing, China. http://hdl.handle.net/20.500.12708/225038
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Publication Type: 
Presentation - Conference Presentation
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Language: 
English
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Authors: 
Waldhör, Dominic 
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Organisational Unit: 
E360-01 - Forschungsbereich Mikroelektronik 
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Date (published): 
Oct-2025
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Event name: 
CAS Frontiers in Science (CASFIS) Symposium 
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Event date: 
13-Oct-2025 - 16-Oct-2025
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Event place: 
Beijing, China
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Keywords: 
reliability; defects; first-principles
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Research facilities: 
Vienna Scientific Cluster 
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Project title: 
Fluoride für die nächste Generation von 2D Nanoelektronik: 101021351 (European Commission) 
Modeling Unconventional Nanoscaled Device FABrication: 871813 (European Commission) 
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Research Areas: 
Nanoelectronics: 40%
Modeling and Simulation: 60%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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