Record link: 
http://hdl.handle.net/20.500.12708/228430
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Title: 
Monolithic Quantum Random Number Generator Containing Si-LED, SPAD and Analog Processing
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Citation: 
Zimmermann, H., Bugl, D., Goll, B., Hofbauer, M., Schneider-Hornstein, K., & Mahmoudi, H. (2026). Monolithic Quantum Random Number Generator Containing Si-LED, SPAD and Analog Processing. In 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Bratislava, Slovakia. IEEE. https://doi.org/10.1109/DDECS69233.2026.11521003
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Publisher DOI: 
10.1109/DDECS69233.2026.11521003
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Publication Type: 
Inproceedings - Full-Paper Contribution
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Language: 
English
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Authors: 
Zimmermann, Horst 
Bugl, David 
Goll, Bernhard 
Hofbauer, Michael 
Schneider-Hornstein, Kerstin 
Mahmoudi, Hiwa 
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Organisational Unit: 
E354-02 - Forschungsbereich Integrated Circuits 
E369-02 - Forschungsbereich Leistungselektronik 
E369-01 - Forschungsbereich Mechatronische Systeme 
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Published in: 
2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) 
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ISBN: 
979-8-3315-8229-6
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DOI of the book: 
10.1109/DDECS69233.2026
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Date (published): 
19-May-2026
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Event name: 
2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) 
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Event date: 
27-Apr-2026 - 29-Apr-2026
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Event place: 
Bratislava, Slovakia
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Number of Pages: 
5
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Publisher: 
IEEE
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Keywords: 
Light emitting diodes; Single-photon avalanche diodes; Printing; Silicon; Timing; Testing; Current; Voltage; Circuits; Breakdown voltage
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Abstract: 
This work describes a monolithically integrated photonic quantum random number generator (QRNG) in 0.35µm CMOS. This QRNG consists of a light-emitting diode inside a deep N-well, a ring single-photon avalanche diode (SPAD), a fast cascoded active quenching and resetting circuit, and an analog evaluation circuit determining whether the random bit is a ”0” or ”1”. The random bits are created by comparison of two consecutive time intervals between photon detections using charging and discharging a capacitor with a constant current as well as a comparator. The time intervals can be in the range from 10 ns to 10 µs. With ±3.3 V supply voltage, the power consumption of the complete circuits is between 1.1 mW and 4.55 mW depending on the LED emission and detection rate of the SPAD. After XOR-hashing, the NIST tests were passed.
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Research Areas: 
Telecommunication: 50%
Sensor Systems: 50%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
Conference Paper

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