In-situ HEXRD analysis of Al alloy EN AW-6082 during homogenization

Abstract

The present work focuses on the microstructure evolution of an aluminium 6082 alloy during the homogenization treatment. In-situ high-energy X-ray diffraction (HEXRD) measurements enable the time-resolved study of the evolution of primary phases like β-Mg₂Si and silicon and the nucleation of new precipitates, such as α-Al₁₅(Fe,Mn)₃Si₂ dispersoids and metastable B′-Al₄Mg₈Si₇. A Python program is developed to evaluate the individual diffraction patterns and to measure the evolution of the selected peak intensities as a function of time, resolving the precipitation and dissolution reactions. Complementary transmission electron microscope (TEM) images at selected temperatures complete the picture of the microstructure evolution during homogenization.