Record link: 
http://hdl.handle.net/20.500.12708/231504
https://doi.org/10.34726/12821
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Title: 
ESREF 2026 : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : Technical Program
en
Citation: 
Waltl, M., Filipovic, L., Grill, A., Knobloch, T., Nelhiebel, M., & Waldhör, D. (Eds.). (2026). ESREF 2026 : European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : Technical Program. https://doi.org/10.34726/12821
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reposiTUm DOI: 
10.34726/12821
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CatalogPlus: 
AC18069562
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Publication Type: 
Proceedings - Abstract Book
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Language: 
English
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Editors: 
Waltl, Michael 
Filipovic, Lado 
Grill, Alexander 
Knobloch, Theresia 
Nelhiebel, Michael 
Waldhör, Dominic 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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ISBN: 
978-3-200-11591-0
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Date (published): 
21-Sep-2026
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Number of Pages: 
134
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Keywords: 
ESREF; Semiconductor Device Reliability; Failure Analysis; Microelectronics; Power Semiconductor Devices; Electronic Packaging Reliability; Defect Characterization; Nanoelectronics
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Research Areas: 
Modeling and Simulation: 50%
Computational Materials Science: 50%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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License: 
CC BY-NC-ND 4.0 CC BY-NC-ND 4.0
en
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