Record link: 
http://hdl.handle.net/20.500.12708/232390
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Title: 
Quantification of LEIS depth profiles by Monte Carlo simulations and reference measurements
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Citation: 
Pichler, J., Celebi, A. T., Bocaniciu, C., & Valtiner, M. (2026). Quantification of LEIS depth profiles by Monte Carlo simulations and reference measurements. In Low Energy Ion Scattering Workshop 2026 : Book of Abstracts (pp. 4–4).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Pichler, Julian 
Celebi, Alper Tunga 
Bocaniciu, Camil 
Valtiner, Markus 
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Organisational Unit: 
E134-02 - Forschungsbereich Applied Interface Physics 
E056-12 - Fachbereich ENROL DP 
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Published in: 
Low Energy Ion Scattering Workshop 2026 : Book of Abstracts 
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Date (published): 
2026
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Event name: 
Low Energy Ion Scattering (LEIS) Workshop 2026 
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Event date: 
4-Jun-2026 - 5-Jun-2026
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Event place: 
Dresden, Germany
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Number of Pages: 
1
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Keywords: 
Monte Carlo simulations; sputtering; LEIS
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Research Areas: 
Surfaces and Interfaces: 100%
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Science Branch: 
1030 - Physik, Astronomie: 100%
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Appears in Collections:
Conference Paper

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