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Record link: 
http://hdl.handle.net/20.500.12708/70642
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Title: 
Analysis of Electromigration in Dual-Damascene Interconnect Structures
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Citation: 
Orio, R., Carniello, S., Ceric, H., & Selberherr, S. (2008). Analysis of Electromigration in Dual-Damascene Interconnect Structures. In ECS Transactions (pp. 337–348). http://hdl.handle.net/20.500.12708/70642
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Orio, Roberto 
Carniello, Sara 
Ceric, Hajdin 
Selberherr, Siegfried 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
ECS Transactions 
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Date (published): 
2008
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Event name: 
Intl. Symposium on Microelectronics Technology and Devices (SBMicro) 
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Event date: 
28-Aug-2006 - 1-Sep-2006
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Event place: 
Ouro Preto, Non-EU
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Number of Pages: 
12
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Conference Paper

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