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Record link: 
http://hdl.handle.net/20.500.12708/72210
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Title: 
The 'Permanent' Component of NBTI: Composition and Annealing
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Citation: 
Grasser, T., Aichinger, T., Pobegen, G., Reisinger, H., Wagner, P.-J., Franco, J., Nelhiebel, M., & Kaczer, B. (2011). The “Permanent” Component of NBTI: Composition and Annealing. In Proceedings of the International Reliability Physics Symposium (IRPS) (p. 9). http://hdl.handle.net/20.500.12708/72210
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Grasser, Tibor 
Aichinger, T. 
Pobegen, G. 
Reisinger, H. 
Wagner, Paul-Jürgen 
Franco, J. 
Nelhiebel, M. 
Kaczer, Ben 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
Proceedings of the International Reliability Physics Symposium (IRPS) 
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Date (published): 
2011
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Event name: 
International Reliability Physics Symposium (IRPS) 
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Event date: 
15-Apr-2007 - 19-Apr-2007
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Event place: 
Phoenix, Non-EU
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Number of Pages: 
9
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Conference Paper

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