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Record link: 
http://hdl.handle.net/20.500.12708/74613
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Title: 
Characterization of the Permanent Component of MOSFET Degradation Mechanisms
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Citation: 
Ullmann, B., Waltl, M., & Grasser, T. (2015). Characterization of the Permanent Component of MOSFET Degradation Mechanisms. In Proceedings of the 2015 Vienna Young Scient Symposium (pp. 36–37). http://hdl.handle.net/20.500.12708/74613
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Ullmann, Bianka 
Waltl, Michael 
Grasser, Tibor 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
Proceedings of the 2015 Vienna Young Scient Symposium 
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Date (published): 
2015
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Event name: 
Vienna Young Scientists Symposium - VSS 2015 
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Event date: 
25-Jun-2015 - 26-Jun-2015
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Event place: 
Wien, Austria
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Number of Pages: 
2
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik, Informationstechnik
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Appears in Collections:
Conference Paper

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