Record link: 
http://hdl.handle.net/20.500.12708/79615
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Title: 
Ion diffusion and migration in semiconductor passivation and encapsulation materials
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Citation: 
Schwab, S. (2017). Ion diffusion and migration in semiconductor passivation and encapsulation materials [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/79615
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CatalogPlus: 
AC14479160
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Publication Type: 
Thesis - Dissertation
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Language: 
English
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Authors: 
Schwab, Stefan 
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Advisor: 
Hutter, Herbert 
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Organisational Unit: 
E164 - Institut für Chemische Technologien und Analytik 
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Date (published): 
2017
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Number of Pages: 
98
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Keywords: 
Ionendiffusion; Ionenmigration; Halbleiter; Transistoren; Zuverlässigkeit; Analytik; TOF-SIMS
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Ion diffusion; Ion migration; Ion mobility; Semiconductor; Reliability; Analytics; TOF-SIMS
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