Image difference metrics for high-resolution electron microscopy

Ederer, Manuel; Löffler, Stefan

doi:10.1016/j.ultramic.2022.113578

Record link:

http://hdl.handle.net/20.500.12708/91422

Title:

Image difference metrics for high-resolution electron microscopy

Citation:

Ederer, M., & Löffler, S. (2022). Image difference metrics for high-resolution electron microscopy. Ultramicroscopy, 240, Article 113578. https://doi.org/10.1016/j.ultramic.2022.113578

Publisher DOI:

10.1016/j.ultramic.2022.113578

CatalogPlus:

AC17204250

Publication Type:

Article - Original Research Article

Language:

English

Authors:

Ederer, Manuel
Löffler, Stefan

Organisational Unit:

E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie

Journal:

Ultramicroscopy

ISSN:

0304-3991

Date (published):

Oct-2022

Number of Pages:

Publisher:

Elsevier

Peer reviewed:

Yes

Keywords:

Humans; Microscopy, Electron, Transmission; Reproducibility of Results; High-resolution; Image difference metric; MSE; SIFT; SSIM; Transmission electron microscopy; Image Processing, Computer-Assisted

Abstract:

Digital image comparison and matching brings many advantages over the traditional subjective human comparison, including speed and reproducibility. Despite the existence of an abundance of image difference metrics, most of them are not suited for high-resolution transmission electron microscopy (HRTEM) images. In this work we adopt two image difference metrics not widely used for TEM images. We compare them to subjective evaluation and to the mean squared error in regards to their behaviour regarding image noise pollution. Finally, the methods are applied to and tested by the task of determining precipitate sizes of a model material.

Project title:

Orbitalkartierung an Grenzflächen: I 4309-N36 (Fonds zur Förderung der wissenschaftlichen Forschung (FWF))

Research Areas:

Visual Computing and Human-Centered Technology: 45%
Materials Characterization: 30%
Composite Materials: 25%

Science Branch:

1030 - Physik, Astronomie: 100%

License:

CC BY 4.0