Japanese Journal of Applied Physics

Title Titel
Japanese Journal of Applied Physics
 
e-ISSN
1347-4065
 
ISSN
0021-4922
 
Publisher Herausgeber
IOP PUBLISHING LTD
 

Publications Publikationen

Results 1-20 of 22 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Gooneratne, Chinthaka P. ; Giouroudi, Ioanna ; Liang, Cai ; Kosel, Jürgen A giant magnetoresistance ring-sensor based microsystem for magnetic bead manipulation and detectionArtikel Article 2011
2Illarionov, Yury Yu. ; Bina, Markus ; Tyaginov, Stanislav E. ; Grasser, Tibor An Analytical Approach for the Determination of the Lateral Trap Position in Ultra-Scaled MOSFETsArtikel Article 2014
3Robertson, John ; Zhong, Guofang ; Esconjauregui, C. Santiago ; Bayer, Bernhard C. ; Zhang, Can ; Fouquet, Martin ; Hofmann, Stephan Applications of Carbon Nanotubes Grown by Chemical Vapor DepositionArtikel Article 2012
4Choi, Jae Kyu ; Vagidov, Nizami ; Sergeev, Andrei ; Kalchmair, Stefan ; Strasser, Gottfried ; Vasko, Fedir ; Mitin, Vladimir Asymmetrically Doped GaAs/AlGaAs Double-Quantum-Well Structure for Voltage-Tunable Infrared DetectionArtikel Article 2012
5Pham, Le Kien ; Midorikawa, K. ; Suda, Martin Attosecond pulse generation using high harmonics of the KrF laser driver pulseArtikel Article 1998
6Illarionov, Yury Yu. ; Waltl, Michael ; Smith, Anderson D. ; Vaziri, Sam ; Ostling, Mikael ; Lemme, Max C. ; Grasser, Tibor Bias-Temperature Instability on the Back Gate of Single-Layer Double-Gated Graphene Field-Effect TransistorsArtikel Article 2016
7Kuzmik, Jan ; Vitanov, Stanislav ; Dua, Christian ; Carlin, Jean-Francois ; Ostermaier, Clemens ; Alexewicz, Alexander ; Strasser, Gottfried ; Pogany, Dionyz ; Gornik, Erich ; Grandjean, Nicolas ; Delage, Sylvain ; Palankovski, Vassil Buffer-Related Degradation Aspects of Single and Double-Heterostructure Quantum Well InAlN/GaN High-Electron-Mobility TransistorsArtikel Article 2012
8Ostermaier, Clemens ; Pozzovivo, Gianmauro ; Basnar, Bernhard ; Schrenk, Werner ; Carlin, Jean-François ; Gonschorek, Marcus ; Grandjean, Nicolas ; Vincze, Andrej ; Tóth, Lajos ; Pécz, Bela ; Strasser, Gottfried ; Pogany, Dionyz ; Kuzmik, Jan Characterization of Plasma-Induced Damage of Selectively Recessed GaN/InAlN/AlN/GaN Heterostructures Using SiCl4 and SF6Artikel Article 2010
9Zhang, Can ; Yan, Feng ; Bayer, Bernhard C. ; Blume, Raoul ; van der Veen, Marleen H. ; Xie, Rongsi ; Zhong, Guofang ; Chen, Bingan ; Knop-Gericke, Axel ; Schlögl, Robert ; Capraro, Bernard D. ; Hofmann, Stephan ; Robertson, John Complementary metal-oxide-semiconductor-compatible and self-aligned catalyst formation for carbon nanotube synthesis and interconnect fabricationArtikel Article 2012
10Kosina, Hans ; Selberherr, Siegfried Coupling of Monte Carlo and Drift Diffusion Method with Applications to Metal Oxide Semiconductor Field Effect TransistorsArtikel Article 1990
11Meneghini, Matteo ; Zanandrea, Alberto ; Rampazzo, Fabiana ; Stocco, Antonio ; Bertin, Marco ; Cibin, Giulia ; Pogany, Dionyz ; Zanoni, Enrico ; Meneghesso, Gaudenzio Electrical and Electroluminescence Characteristics of AlGaN/GaN High Electron Mobility Transistors Operated in Sustainable Breakdown ConditionsArtikel Article 2013
12Koblmüller, G. ; Brown, Jay ; Averbeck, R. ; Riechert, H. ; Pongratz, Peter ; Speck, James Ga Adlayer Governed Surface Defect Evolution of (0001)GaN Films Grown by Plasma-Assisted Molecular Beam EpitaxyArtikel Article 2005
13Tapajna, Milan ; Kuzmik, Jan ; Cico, Karol ; Pogany, Dionyz ; Pozzovivo, Gianmauro ; Strasser, Gottfried ; Abermann, Stephan ; Bertagnolli, Emmerich ; Carlin, Jean-François ; Grandjean, Nicolas ; Fröhlich, Karol Interface States and Trapping Effects in Al₂O₃ and ZrO₂/InAlN/AlN/GaN Metal-Oxide-Semiconductor HeterostructuresArtikel Article 2009
14Brezna, Wolfgang ; Smoliner, Jürgen Investigation of contact-force dependent effects in conductive atomic force microscopy on Si and GaAsArtikel Article 2008
15Süss, Dieter ; Fidler, Josef ; Porath, Karina ; Schrefl, Thomas ; Weller, Dieter Micromagnetic study of pinning behavior in percolated mediaArtikel Article 2006
16Tyaginov, Stanislav ; Bina, Markus ; Franco, Jacopo ; Wimmer, Yannick ; Kaczer, Ben ; Grasser, Tibor On the Importance of Electron-Electron Scattering for Hot-Carrier DegradationArtikel Article 2015
17Jech, Markus ; Sharma, Prateek ; Tyaginov, Stanislav ; Rudolf, Florian ; Grasser, Tibor On the Limits of Applicability of Drift-Diffusion Based Hot Carrier Degradation ModelingArtikel Article 2016
18Giouroudi, Ioanna ; van den Driesche, Sander ; Kosel, Jürgen ; Grössinger, Roland ; Vellekoop, Michael J. On-chip bio-analyte detection utilizing the velocity of magnetic microparticles in a fluidArtikel Article 2011
19Zeiringer, Isolde ; Bauer, Ernst ; Grytsiv, Andriy ; Rogl, Peter ; Effenberger, Herta Phase Equilibria, Crystal Chemistry, and Physical Properties of Ag-Ba-Si ClathratesArtikel Article 2011
20Le Kien, Fam ; Koreeda, A. ; Kuroda, K. ; Suzuki, M. ; Hakuta, K. Temperature dependence of the Raman shift and Raman width of solid parahydrogen: Effect of vibron-phonon scatteringArtikel Article 2003