Hutter, Herbert

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Full name Familienname, Vorname
Hutter, Herbert
 
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Own Publications Eigene Publikationen

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Subject:  TOF-SIMS

Results 1-5 of 5 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Franz, R. ; Schnöller, J. ; Hutter, H. ; Mitterer, C. Oxidation and diffusion study on AlCrVN hard coatings using oxygen isotopes ¹⁶O and ¹⁸OArtikel Article2011
2Wiesinger, Rita ; Schnöller, Johannes ; Hutter, Herbert ; Schreiner, Manfred ; Kleber, Christoph About the Formation of Basic Silver Carbonate on Silver Surfaces - An In Situ IRRAS StudyArtikel Article2009
3Schnöller, J. ; Wiesinger, R. ; Kleber, C. ; Hilfrich, U. ; Schreiner, M. ; Hutter, H. TOF-SIMS investigations on weathered silver surfacesArtikel Article 2008
4Kleber, Ch. ; Wiesinger, R. ; Schnöller, J. ; Hilfrich, U. ; Hutter, H. ; Schreiner, M. Initial oxidation of silver surfaces by S²⁻and S⁴⁺ speciesArtikel Article 2008
5Puchner, Stefan ; Hutter, Herbert ; Schnöller, Johannes TOF-SIMS Investigations on Oxide and Nitride LayersPräsentation Presentation2007

Contributing Publications Mitbeteiligte Publikationen

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Subject:  TOF-SIMS

Results 1-11 of 11 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Moser Charlotte - 2024 - Studie der Si-Diffusion in UEbergangsmetalldiboriden...pdf.jpgMoser, Charlotte Studie der Si-Diffusion in Übergangsmetalldiboriden mittels Sekundärionenflugzeitmassen spektrometer (TOF-SIMS)Thesis Hochschulschrift 2024
2Bohrn, Fabian ion migration studies in epoxy molding compoundsThesis Hochschulschrift2022
3Volgger, Lukas Characterisation of nickel-based metallisations for the soldering of microchipsThesis Hochschulschrift2019
4Amsüss, Andreas Diffusion and phase formation in the Al-Cu thin film system investigated with ToF-SIMS and grazing incidence X-ray diffractionThesis Hochschulschrift2019
5Leitzenberger, Michael Migration mobiler Ionen in SiliziumoxidenThesis Hochschulschrift2018
6Schwab, Stefan Ion diffusion and migration in semiconductor passivation and encapsulation materialsThesis Hochschulschrift2017
7Larisegger, Silvia Corrosion phenomena and corrosion prevention of copper electrodes in semiconductor devicesThesis Hochschulschrift2015
8Fugger, Michael Integrity of diffusion barriers in modern high-voltage power semiconductorsThesis Hochschulschrift2014
9Schnöller, Johannes TOF-SIMS - a versatile technique in analytical chemistryThesis Hochschulschrift2009
10Haas, Philipp Investigation of implantations in SiGe with TOF-SIMSThesis Hochschulschrift2007
11Puchner, Stefan Thin layer analysis with TOF-SIMSThesis Hochschulschrift2007