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Nelhiebel, M.
 

Own Publications Eigene Publikationen

Results 1-20 of 30 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wieland, D. ; Ofner, S. ; Stabentheiner, Manuel ; Butej, Boris ; Koller, C. ; Sun, J. ; Minetto, A ; Reiser, K. ; Häberlen, O. ; Nelhiebel, M. ; Glavanovics, M ; Pogany, D. ; Ostermaier, C A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit testsInproceedings Konferenzbeitrag 2023
2Schwab S - 2017 - Reduction of Sodium Migration in Polymers by Addition of...pdf.jpgSchwab, Stefan ; Jung, J. P. H. ; Appenroth, Julia ; Pittenauer, Ernst ; Allmaier, Günter ; Gruber, Sabine ; Bauer, M. ; Miethaner, Stefan ; Nelhiebel, M. ; Hutter, Herbert Reduction of Sodium Migration in Polymers by Addition of 15-Crown-5 Ether as Getter SubstanceArticle Artikel 2017
3Walter, T. ; Khatibi, G. ; Nelhiebel, M. ; Heinz, W. ; Robl, W. High cycle fatigue properties of Cu filmsArtikel Article2015
4Walter, T. ; Khatibi, G. ; Nelhiebel, M. ; Heinz, W. ; Robl, W. High cycle fatigue properties of Cu filmsArtikel Article2014
5Aichinger, T. ; Lenahan, P. M. ; Grasser, Tibor ; Pobegen, G. ; Nelhiebel, M. Evidence for Pb Center-Hydrogen Complexes after Subjecting PMOS Devices to NBTI Stress - a Combined DCIV/SDR StudyKonferenzbeitrag Inproceedings2012
6Köck, Helmut ; Djelassi, Christian ; de Filippis, Stefano ; Nelhiebel, M. ; Ladurner, Markus ; Glavanovics, Michael ; Pogany, Dionyz Improved thermal management of low voltage power devices with optimized bond wire positionsPräsentation Presentation2011
7Grasser, T. ; Wagner, P.-J. ; Reisinger, H. ; Aichinger, Th. ; Pobegen, G. ; Nelhiebel, M. ; Kaczer, B. Analytic modeling of the bias temperature instability using capture/emission time mapsKonferenzbeitrag Inproceedings2011
8Grasser, Tibor ; Aichinger, T. ; Pobegen, G. ; Reisinger, H. ; Wagner, Paul-Jürgen ; Franco, J. ; Nelhiebel, M. ; Kaczer, Ben The 'Permanent' Component of NBTI: Composition and AnnealingKonferenzbeitrag Inproceedings2011
9Pobegen, G. ; Aichinger, T. ; Grasser, Tibor ; Nelhiebel, M. Impact of Gate Poly Doping and Oxide Thickness on the N- and PBTI in MOSFETsKonferenzbeitrag Inproceedings2011
10Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang ; Reisinger, H. ; Aichinger, T. ; Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Schanovsky, Franz ; Franco, J. ; Toledano-Luque, M. ; Nelhiebel, M. The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide TrapsArtikel Article 2011
11Pobegen, G. ; Aichinger, T. ; Nelhiebel, M. ; Grasser, Tibor Dependence of the Negative Bias Temperature Instability on the Gate Oxide ThicknessKonferenzbeitrag Inproceedings2010
12Grasser, T. ; Kaczer, B. ; Goes, W. ; Reisinger, H. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Schanovsky, F. ; Franco, J. ; Roussel, Ph. ; Nelhiebel, M. Recent advances in understanding the bias temperature instabilityKonferenzbeitrag Inproceedings2010
13Aichinger, T. ; Nelhiebel, M. ; Grasser, Tibor Energetic Distribution of Oxide Traps created under Negative Bias Temperature Stress and their Relation to HydrogenArtikel Article2010
14Aichinger, T. ; Nelhiebel, M. ; Einspieler, S. ; Grasser, Tibor In Situ Poly Heater-A Reliable Tool for Performing Fast and Defined Temperature Switches on ChipArtikel Article2010
15Grasser, T. ; Aichinger, Th. ; Reisinger, H. ; Franco, J. ; Wagner, P.-J. ; Nelhiebel, M. ; Ortolland, C. ; Kaczer, B. On the ‘permanent’ component of NBTIKonferenzbeitrag Inproceedings2010
16Aichinger, T. ; Nelhiebel, M. ; Einspieler, S. ; Grasser, Tibor Observing Two Stage Recovery of Gate Oxide Damage Created under Negative Bias Temperature StressArtikel Article2010
17Aichinger, T. ; Puchner, S. ; Nelhiebel, M. ; Grasser, Tibor ; Hutter, H. Impact of Hydrogen on Recoverable and Permanent Damage following Negative Bias Temperature StressKonferenzbeitrag Inproceedings2010
18Aichinger, T. ; Nelhiebel, M. ; Grasser, Tibor Unambiguous Identification of the NBTI Recovery Mechanism using Ultra-Fast Temperature ChangesKonferenzbeitrag Inproceedings2009
19Aichinger, T. ; Nelhiebel, M. ; Grasser, Tibor On the Temperature Dependence of NBTI RecoveryKonferenzbeitrag Inproceedings2009
20Wagner, Paul-Jürgen ; Aichinger, T. ; Grasser, Tibor ; Nelhiebel, M. ; Vandamme, L.K.J. Possible Correlation between Flicker Noise and Bias Temperature StressKonferenzbeitrag Inproceedings2009