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Record link: 
http://hdl.handle.net/20.500.12708/71446
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Title: 
Impact of Hydrogen on Recoverable and Permanent Damage following Negative Bias Temperature Stress
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Citation: 
Aichinger, T., Puchner, S., Nelhiebel, M., Grasser, T., & Hutter, H. (2010). Impact of Hydrogen on Recoverable and Permanent Damage following Negative Bias Temperature Stress. In Proceedings of the International Reliability Physics Symposium (IRPS) (pp. 1063–1068). http://hdl.handle.net/20.500.12708/71446
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Aichinger, T. 
Puchner, S. 
Nelhiebel, M. 
Grasser, Tibor 
Hutter, H. 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
Proceedings of the International Reliability Physics Symposium (IRPS) 
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Date (published): 
2010
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Event name: 
International Reliability Physics Symposium (IRPS) 
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Event date: 
15-Apr-2007 - 19-Apr-2007
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Event place: 
Phoenix, Non-EU
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Number of Pages: 
6
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Conference Paper

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