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Record link: 
http://hdl.handle.net/20.500.12708/72498
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Title: 
Analytic modeling of the bias temperature instability using capture/emission time maps
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Citation: 
Grasser, T., Wagner, P.-J., Reisinger, H., Aichinger, Th., Pobegen, G., Nelhiebel, M., & Kaczer, B. (2011). Analytic modeling of the bias temperature instability using capture/emission time maps. In 2011 International Electron Devices Meeting. IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, Non-EU. https://doi.org/10.1109/iedm.2011.6131624
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Publisher DOI: 
10.1109/iedm.2011.6131624
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Grasser, T. 
Wagner, P.-J. 
Reisinger, H. 
Aichinger, Th. 
Pobegen, G. 
Nelhiebel, M. 
Kaczer, B. 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
2011 International Electron Devices Meeting 
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Date (published): 
2011
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Event name: 
IEEE International Electron Devices Meeting (IEDM) 
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Event date: 
11-Dec-1988 - 14-Dec-1988
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Event place: 
San Francisco, CA, USA, Non-EU
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Number of Pages: 
4
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Conference Paper

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