Stöger-Pollach, M., Löffler, S., Maurer, N., & Bukvišová, K. (2020). Using Čerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence. Ultramicroscopy, 214, Article 113011. https://doi.org/10.1016/j.ultramic.2020.113011
E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie E138-03 - Forschungsbereich Functional and Magnetic Materials E138 - Institut für Festkörperphysik
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Journal:
Ultramicroscopy
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ISSN:
0304-3991
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Date (published):
Jul-2020
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Number of Pages:
5
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Publisher:
ELSEVIER
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Peer reviewed:
Yes
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Keywords:
Electronic, Optical and Magnetic Materials; Atomic and Molecular Physics and Optics; Instrumentation; Čerenkov; Radiation; Cathodoluminescence; VEELS
en
Abstract:
Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Čerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Pérot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).