Record link: 
http://hdl.handle.net/20.500.12708/149010
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Title: 
The Chemical Capacitance as a Fingerprint of Defect Chemistry in Mixed Conducting Oxides
en
Citation: 
Fleig, J., Schmid, A., Rupp, G., Slouka, C., Navickas, E., Andrejs, L., Hutter, H., Volgger, L., & Nenning, A. (2016). The Chemical Capacitance as a Fingerprint of Defect Chemistry in Mixed Conducting Oxides. Acta Chimica Slovenica, 63(3), 509–518. https://doi.org/10.17344/acsi.2016.2302
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Publisher DOI: 
10.17344/acsi.2016.2302
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Fleig, Jürgen 
Schmid, Alexander 
Rupp, Ghislain 
Slouka, Christoph 
Navickas, Edvinas 
Andrejs, Lukas 
Hutter, Herbert 
Volgger, Lukas 
Nenning, Andreas 
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Organisational Unit: 
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie 
E164-04-3 - Forschungsgruppe Festkörperionik 
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Journal: 
Acta Chimica Slovenica 
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ISSN: 
1318-0207
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Date (published): 
2016
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Number of Pages: 
10
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Publisher: 
SLOVENSKO KEMIJSKO DRUSTVO
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Peer reviewed: 
Yes
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Research Areas: 
Materials Characterization: 100%
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Science Branch: 
Chemie
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Appears in Collections:
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