A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides

Holzlechner, Gerald; Kubicek, Markus; Hutter, Herbert; Fleig, Jürgen

doi:10.1039/c3ja50059d

Record link:

http://hdl.handle.net/20.500.12708/155157

Title:

A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides

Citation:

Holzlechner, G., Kubicek, M., Hutter, H., & Fleig, J. (2013). A novel ToF-SIMS operation mode for improved accuracy and lateral resolution of oxygen isotope measurements on oxides. Journal of Analytical Atomic Spectrometry, 28(7), 1648. https://doi.org/10.1039/c3ja50059d

Publisher DOI:

10.1039/c3ja50059d

Publication Type:

Article - Original Research Article

Language:

English

Authors:

Holzlechner, Gerald
Kubicek, Markus
Hutter, Herbert
Fleig, Jürgen

Organisational Unit:

E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
E164-04-3 - Forschungsgruppe Festkörperionik

Journal:

Journal of Analytical Atomic Spectrometry

ISSN:

0267-9477

Date (published):

2013

Number of Pages:

Publisher:

ROYAL SOC CHEMISTRY

Peer reviewed:

Yes

Keywords:

Spectroscopy; Analytical Chemistry

Research Areas:

Materials Characterization: 50%
Structure-Property Relationship: 50%

Science Branch:

Chemie

Appears in Collections:

Article

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