Record link: 
http://hdl.handle.net/20.500.12708/196186
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Title: 
Observation of Rich Defect Dynamics in Monolayer MoS₂
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Citation: 
Ravichandran, H., Knobloch, T., Pannone, A., Karl, A., Stampfer, B., Waldhör, D., Zheng, Y., Sakib, N., Karim Sadaf, M., Pendurthi, R., Torsi, R., Robinson, J. A., Grasser, T., & Das, S. (2023). Observation of Rich Defect Dynamics in Monolayer MoS₂. ACS Nano, 17(15), 14449–14460. https://doi.org/10.1021/acsnano.2c12900
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Publisher DOI: 
10.1021/acsnano.2c12900
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Publication Type: 
Article - Original Research Article
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Language: 
English
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Authors: 
Ravichandran, Harikrishnan 
Knobloch, Theresia 
Pannone, Andrew 
Karl, Alexander 
Stampfer, Bernhard 
Waldhör, Dominic 
Zheng, Yikai 
Sakib, Najam 
Karim Sadaf, Muhatsim 
Pendurthi, Rahul 
Torsi, Riccardo 
Robinson, Joshua A. 
Grasser, Tibor 
Das, Saptarshi 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Journal: 
ACS Nano 
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ISSN: 
1936-0851
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Date (published): 
25-Jul-2023
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Number of Pages: 
12
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Publisher: 
AMER CHEMICAL SOC
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Peer reviewed: 
Yes
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Keywords: 
random telegraph signals; MoS2; Al2O3; defects; field-effect transistors; charge trapping,; reliability
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Research facilities: 
Vienna Scientific Cluster 
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Project title: 
Fluoride für die nächste Generation von 2D Nanoelektronik: 101021351 (European Commission) 
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Research Areas: 
Nanoelectronics: 70%
Modeling and Simulation: 30%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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