reposiTUm: Usage of advanced analytical techniques assessing the influence of Si on the stabilization of amorphous Al2O3-based thin films

Record link:

http://hdl.handle.net/20.500.12708/221107

Title:

Usage of advanced analytical techniques assessing the influence of Si on the stabilization of amorphous Al2O3-based thin films

Citation:

Scholz, F., Hemetsberger, J., Laudani, F., Rath, J., Sauer, M., Fahrnberger, F., Hahn, M., Hutter, H., Gies, A., Kolozsvári, S., Salvadores Farran, N., Foelske, A., & Riedl-Tragenreif, H. (2025, September 7). Usage of advanced analytical techniques assessing the influence of Si on the stabilization of amorphous Al2O3-based thin films [Poster Presentation]. SIMS Europe 2025, Gießen, Germany. http://hdl.handle.net/20.500.12708/221107

Publication Type:

Presentation - Poster Presentation

Language:

English

Organisational Unit:

E057-05 - Fachbereich Analytical Instrumentation Center
E308-01-2 - Forschungsgruppe Angewandte Oberflächentechnik
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials

Date (published):

7-Sep-2025

Event name:

SIMS Europe 2025

Event date:

7-Sep-2025 - 9-Sep-2025

Event place:

Gießen, Germany

Keywords:

PVD coatings; Insulating coatings; TOF-SIMS

Research facilities:

Analytical Instrumentation Center
Röntgenzentrum

Project title:

3 dimensionale Nanoanalytik von Hochleistungsmaterialien mittels Flugzeit aufgelöster Sekundärionen Massenspektrometrie: 902876 (FFG - Österr. Forschungsförderungs- gesellschaft mbH)

Research Areas:

Materials Characterization: 50%
Surfaces and Interfaces: 50%

Science Branch:

1040 - Chemie: 40%
2040 - Chemische Verfahrenstechnik: 20%
2050 - Werkstofftechnik: 40%

Appears in Collections:

Presentation

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