Record link: 
http://hdl.handle.net/20.500.12708/231616
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Title: 
Oxygen-Ion Conductivity and Defect Mobility in Perovskite MIEC Thin Films
en
Citation: 
Guicherd, J., Siebenhofer, M., Venclik, B., Hutter, H., Fleig, J., & Kubicek, M. (2026, July 6). Oxygen-Ion Conductivity and Defect Mobility in Perovskite MIEC Thin Films [Poster Presentation]. 25th International Conference on Solid State Ionics (SSI 2026), Singapore, Singapore. http://hdl.handle.net/20.500.12708/231616
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Publication Type: 
Presentation - Poster Presentation
en
Language: 
English
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Authors: 
Guicherd, Joachim 
Siebenhofer, Matthäus 
Venclik, Bastian 
Hutter, Herbert 
Fleig, Jürgen 
Kubicek, Markus 
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Organisational Unit: 
E164-04-3 - Forschungsgruppe Festkörperionik 
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie 
E057-05 - Fachbereich Analytical Instrumentation Center 
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Date (published): 
6-Jul-2026
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Event name: 
25th International Conference on Solid State Ionics (SSI 2026) 
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Event date: 
5-Jul-2026 - 10-Jul-2026
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Event place: 
Singapore, Singapore
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Keywords: 
perovskite; Thin Films
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Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 50%
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Science Branch: 
1040 - Chemie: 100%
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