Record link: 
http://hdl.handle.net/20.500.12708/75095
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Title: 
On The Fly Characterization of Charge Trapping Phenomena at GaN/Dielectric and GaN/AlGaN/Dielectric Interfaces Using Impedance Measurements
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Citation: 
Stradiotto, R., Pobegen, G., Ostermaier, C., & Grasser, T. (2015). On The Fly Characterization of Charge Trapping Phenomena at GaN/Dielectric and GaN/AlGaN/Dielectric Interfaces Using Impedance Measurements. In 2015 45th European Solid State Device Research Conference (ESSDERC) - Proceedings. European Solid-State Device Research Conference (ESSDERC), Montreux, Austria. https://doi.org/10.1109/ESSDERC.2015.7324716
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Publisher DOI: 
10.1109/ESSDERC.2015.7324716
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Language: 
English
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Authors: 
Stradiotto, Roberta 
Pobegen, Gregor 
Ostermaier, Clemens 
Grasser, Tibor 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
2015 45th European Solid State Device Research Conference (ESSDERC) - Proceedings 
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DOI of the book: 
10.1109/ESSDERC36343.2015
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Date (published): 
2015
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Event name: 
European Solid-State Device Research Conference (ESSDERC) 
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Event date: 
16-Sep-1991 - 19-Sep-1991
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Event place: 
Montreux, Austria
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Number of Pages: 
4
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Science Branch: 
Elektrotechnik, Elektronik, Informationstechnik
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Appears in Collections:
Conference Paper

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