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| | Preview | Author(s) | Title | Type | Issue Date |
| 21 | | Goes, Wolfgang ; Toledano-Luque, Maria ; Schanovsky, Franz ; Bina, Markus ; Baumgartner, Oskar ; Kaczer, Ben ; Grasser, Tibor | (Invited) Multiphonon Processes as the Origin of Reliability Issues | Konferenzbeitrag Inproceedings | 2013 |
| 22 | | Okorn-Schmidt, Harald F. ; Holsteyns, Frank ; Lippert, Alexander ; Mui, David ; Kawaguchi, Mark ; Lechner, Christiane ; Frommhold, Philipp E. ; Nowak, Till ; Mettin, Robert | (Invited) Particle Cleaning Technologies to Meet Advanced Semiconductor Device Process Requirements | Konferenzbeitrag Inproceedings | 2013 |
| 23 | | Sverdlov, Viktor ; Selberherr, Siegfried | (Invited) Spin-Based Silicon and CMOS-Compatible Devices | Buchbeitrag Book Contribution  | 2015 |
| 24 | | Filipovic, Lado ; Lahlalia, Ayoub | (Invited)<i />System-on-Chip Sensor Integration in Advanced CMOS Technology | Buchbeitrag Book Contribution | 2018 |
| 25 | | Ungersboeck, Enzo ; Sverdlov, Viktor ; Kosina, Hans ; Selberherr, Siegfried | Low-Field Electron Mobility in Stressed UTB SOI MOSFETs for Different Substrate Orientations | Buchbeitrag Book Contribution | 2006 |
| 26 | | Sverdlov, Viktor ; Selberherr, Siegfried | Mobility Modeling in Advanced MOSFETs with Ultra-Thin Silicon Body under Stress | Konferenzbeitrag Inproceedings | 2008 |
| 27 | | De Orio, Roberto L. ; Ceric, Hajdin ; Selberherr, Siegfried | Modeling Electromigration Lifetimes of Copper Interconnects | Konferenzbeitrag Inproceedings | 2011 |
| 28 | | Ungersböck, Stephan Enzo ; Sverdlov, Viktor ; Kosina, Hans ; Selberherr, Siegfried | Modeling of Advanced Semiconductor Devices | Konferenzbeitrag Inproceedings | 2006 |
| 29 | | Ungersboeck, Enzo ; Sverdlov, Viktor ; Kosina, Hans ; Selberherr, Siegfried | Modeling of Advanced Semiconductor Devices | Buchbeitrag Book Contribution | 2006 |
| 30 | | Fleig, Jürgen ; Opitz, Alexander ; Schintlmeister, Arno ; Kubicek, Markus ; Hutter, Herbert | Monitoring Active and Resistive Zones of SOFC Cathodes by Voltage Driven Tracer Incorporation | Konferenzbeitrag Inproceedings | 2011 |
| 31 | | Windbacher, Thomas ; Makarov, Alexander ; Sverdlov, Viktor ; Selberherr, Siegfried | Novel Buffered Magnetic Logic Gate Grid | Buchbeitrag Book Contribution | 2015 |
| 32 | | Karner, Markus ; Holzer, Stefan ; Gös, Wolfgang ; Vasicek, Martin ; Wagner, Martin ; Kosina, Hans ; Selberherr, Siegfried | Numerical Analysis of Gate Stacks | Buchbeitrag Book Contribution | 2006 |
| 33 | | Tyaginov, Stanislav E. ; Starkov, Ivan ; Enichlmair, Hubert ; Park, Jong Mun ; Jungemann, Christoph ; Grasser, Tibor | Physics-Based Hot-Carrier Degradation Modeling | Buchbeitrag Book Contribution | 2011 |
| 34 | | Wagner, Martin ; Span, Gerhard ; Holzer, Stefan ; Palankovski, Vassil ; Triebl, Oliver ; Grasser, Tibor | Power Output Improvement of Silicon-Germanium Thermoelectric Generators | Buchbeitrag Book Contribution | 2006 |
| 35 | | Osintsev, Dmitri ; Sverdlov, Victor ; Stanojevic, Zlatan ; Makarov, Alexander ; Weinbub, Josef ; Selberherr, Siegfried | Properties of Silicon Ballistic Spin Fin-Based Field-Effect Transistors | Buchbeitrag Book Contribution | 2011 |
| 36 | | Henkel, Christoph ; Abermann, Stephan ; Bethge, Ole ; Bertagnolli, Emmerich | Pt/Ge Schottky-Barrier Reduction by Rapid Thermal Diffusion of P Dopants | Buchbeitrag Book Contribution | 2010 |
| 37 | | Osintsev, Dmitri ; Sverdlov, Viktor ; Selberherr, Siegfried | Spin Lifetime Enhancement by Shear Strain in Thin Silicon-On-Insulator Films | Buchbeitrag Book Contribution | 2013 |
| 38 | | Filipovic, Lado ; Selberherr, Siegfried | Stress Considerations in Thin Films for CMOS-Integrated Gas Sensors | Buchbeitrag Book Contribution | 2015 |
| 39 | | Januschewsky, Judith ; Kubicek, Markus ; Stoeger-Pollach, Michael ; Bernardi, Johannes ; Fleig, Juergen | Structural and Chemical Investigations of (La, Sr)CoO<sub>3-δ</sub> Thin Film Electrodes Exhibiting Very Fast Oxygen Reduction Kinetics | Konferenzbeitrag Inproceedings | 2009 |
| 40 | | Stanojevic, Zlatan ; Sverdlov, Victor ; Selberherr, Siegfried | Subband Structure Engineering in Silicon-On-Insulator FinFETs Using Confinement | Konferenzbeitrag Inproceedings | 2011 |
