Schneider, Michael

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Schneider, Michael
 
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Results 141-160 of 167 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
141Frischmuth, Tobias ; Maurer, Daniel ; Schneider, Michael ; Grille, Thomas ; Schmid, Ulrich IMPACT OF SUBSTRATE TEMPERATURE AND INDUCTIVELY COUPLED PLASMA POWER ON a-SiC:H THIN FILM PROPERTIESKonferenzbeitrag Inproceedings2015
142Stöber, Laura ; Schneider, Michael ; Schmid, Ulrich Impact of Contact Material Deposition Technique on the Properties of Ti/4H-SiC Schottky StructuresKonferenzbeitrag Inproceedings 2015
143Schneider, M. ; Bittner, A. ; Schmid, P. ; Schmid, U. Impact of C-axis Orientation of Aluminium Nitride Thin Films on the Long-term Stability and Mechanical Properties of Resonantly Excited MEMS CantileversKonferenzbeitrag Inproceedings 2014
144Iannacci, J. ; Serra, Enrico ; Sordo, Guido ; Bonaldi, M. ; Borielli, A. ; Schmid, Ulrich ; Bittner, Achim ; Schneider, Michael ; Kuenzig, T. ; Schrag, G. ; Pandraud, G. ; Sarro, P. M. MEMS Based Multi Modal Vibration Energy Harvesters for Ultra Low Power Autonomous Remote and Distributed SensingKonferenzbeitrag Inproceedings2014
145Frischmuth, Tobias ; Schneider, Michael ; Grille, Thomas ; Schmid, Ulrich Effect of Reactive Gas Flow Ratio on IC-PECVD Deposited a-SiC:H Thin FilmsKonferenzbeitrag Inproceedings 2014
146Schneider, Michael ; Bittner, Achim ; Schmid, Ulrich Characterization of the Mechanical and Piezoelectric Properties of Aluminium Nitride Thin Films at Varying Film ThicknessPräsentation Presentation2014
147Schneider, M. ; Bittner, A. ; Schmid, U. Thickness dependence of Young's modulus and residual stress of sputtered aluminum nitride thin filmsArtikel Article2014
148Schneider, Michael ; Bittner, Achim ; Schmid, Ulrich Temperature dependant dielectric breakdown of sputter‑deposited AlN thin films using a time‑zero approachArtikel Article2014
149Derntl, R. ; Schneider, Michael ; Schalko, Johannes ; Bittner, Achim ; Schmiedmayer, Hannes-Jörg ; Schmid, Ulrich ; Trupke, Michael Arrays of open, independently tunable microcavitiesArtikel Article2014
150Schneider, Michael Einfluss der Schichtdicke und der Substratvorbehandlung auf die elektro-mechanischen Eigenschaften von gesputterten Aluminiumnitrid-DünnfilmenThesis Hochschulschrift2014
151Beigelbeck, Roman ; Schneider, Michael ; Stifter, Michael ; Voglhuber-Brunnmaier, Thomas ; Jakoby, Bernhard ; Schmid, Ulrich ; Keplinger, Franz Novel exact closed-form solutions for the resonant frequencies and mode-shapes of Euler-Bernoulli beams with constant thickness and polynomial widthKonferenzbeitrag Inproceedings2014
152Beigelbeck, Roman ; Stifter, Michael ; Schneider, Michael ; Keplinger, Franz ; Schmid, Ulrich ; Voglhuber-Brunnmaier, Thomas ; Jakoby, Bernhard Rigorous Analytical Analysis of Resonant Euler-Bernoulli Beams with Constant Thickness and Polynomial WidthKonferenzbeitrag Inproceedings2014
153Beigelbeck, Roman ; Schneider, Michael ; Schalko, Johannes ; Bittner, Achim ; Schmid, Ulrich A two-step load-deflection procedure applicable to extract the Young's modulus and the residual tensile stress of circularly shaped thin-film diaphragmsArtikel Article 2014
154Stöber, Laura ; Konrath, J.P. ; Schneider, Michael ; Schmid, Ulrich Usability of Molybdenum and Molybdenum Nitride Thin Films for Microsystem ApplicationsKonferenzbeitrag Inproceedings2014
155Schneider, Michael ; Bittner, Achim ; Schmid, Ulrich Investigation on the Dielectric Behavior of Aluminum Nitride Thin Films at Different Temperatures Applying a Time-zero ApproachKonferenzbeitrag Inproceedings2013
156Lugstein, Alois ; Mijić, Mario ; Burchhart, Thomas ; Zeiner, Clemens ; Langegger, Rupert ; Schneider, Michael ; Schmid, Ulrich ; Bertagnolli, Emmerich In situ monitoring of Joule heating effects in germanium nanowires by -Raman spectroscopyArtikel Article2013
157Derntl, Christian ; Schalko, Johannes ; Schneider, Michael ; Bittner, Achim ; Schmid, U. ; Schmiedmayer, Hannes-Jörg ; Trupke, Michael Arrays of open, independently tunable microcavities for quantum emittersPräsentation Presentation2013
158Schneider, Michael ; Strunz, Tobias ; Bittner, Achim ; Schmid, Ulrich Impact of Sputter Deposition Parameters on the Leakage Current Behavior of Aluminum Nitride Thin FilmsArtikel Article2012
159Alamin Dow, Ali B. ; Schneider, M. ; Koo, David ; Al-Rubaye, Hasan A. ; Bittner, A. ; Schmid, U. ; Kherani, Nazir Modeling the performance of a micromachined piezoelectric energy harvesterArtikel Article2012
160Dow, Ali B. Alamin ; Lin, H. ; Schneider, M. ; Petkov, C. ; Bittner, A. ; Ahmed, A. ; Popov, C. ; Schmid, U. ; Kherani, N. P. Ultrananocrystalline Diamond-Based High-Velocity SAW Device Fabricated by Electron Beam LithographyArtikel Article2012