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Full name Familienname, Vorname
Waldhör, Dominic
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 33 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wilhelmer, Christoph ; Waldhör, Dominic ; Milardovich, Diego ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Electron Trapping in Amorphous Silicon Nitride (a-Si3N4:H)Inproceedings Konferenzbeitrag20-Nov-2023
2Wilhelmer-2023-Nanomaterials-vor.pdf.jpgWilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Milardovich, Diego ; Waltl, Michael ; Grasser, Tibor Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4)Article Artikel Aug-2023
3Wilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab initio investigations of electron and hole trapping processes of H induced defects in amorphous SiO₂Inproceedings Konferenzbeitrag12-Jun-2023
4Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Charge Trapping Sites in Amorphous Si₃N₄Presentation Vortrag30-May-2023
5Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Charged instrinsic defect states in amorphous Si3N4Presentation Vortrag29-May-2023
6Cvitkovich, Lukas ; Waldhör, Dominic ; El-Sayed, Al-Moatasem ; Jech, Markus ; Wilhelmer, Christoph ; Grasser, Tibor Ab-Initio Modeling of the Initial Stages of Si(100) Thermal OxidationKonferenzbeitrag Inproceedings2022
7Wilhelmer, Christoph ; Waldhör, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab-Initio Study of Multi-State Defects in Amorphous SiO2Konferenzbeitrag Inproceedings2022
8Milardovich, Diego ; Waldhoer, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem Bellah ; Grasser, Tibor Building Robust Machine Learning Force Fields by Composite Gaussian Approximation PotentialsKonferenzbeitrag Inproceedings 2022
9Milardovich, Diego ; Jech, Markus ; Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Grasser, Tibor Machine Learning Prediction of Defect Structures in Amorphous Silicon DioxideKonferenzbeitrag Inproceedings2022
10Waltl, Michael ; Knobloch, Theresia ; Tselios, Konstantinos ; Filipovic, Lado ; Stampfer, Bernhard ; Hernandez, Yoanlys ; Waldhör, Dominic ; Illarionov, Yury ; Kaczer, Ben ; Grasser, Tibor Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?Artikel Article 2022
11Wilhelmer, Christoph ; Waldhoer, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem Bellah ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole captureArtikel Article 2022
12Ducry, Fabian ; Waldhoer, Dominic ; Knobloch, Theresia ; Csontos, Miklos ; Jimenez Olalla, Nadia ; Leuthold, Juerg ; Grasser, Tibor ; Luisier, Mathieu An Ab Initio Study on Resistance Switching in Hexagonal Boron NitrideArtikel Article 2022
13Waltl-2021-Microelectronics Reliability-vor.pdf.jpgWaltl, Michael ; Waldhör, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor Impact of single-defects on the variability of CMOS inverter circuitsArticle Artikel Nov-2021
14El-Sayed, Al-Moatasem ; Seiler, Heribert ; Kosina, Hans ; Jech, Markus ; Waldhör, Dominic ; Sverdlov, Viktor First Principles Evaluation of Topologically Protected Edge States in MoS$_{2}$ 1T′ Nanoribbons with Realistic TerminationsKonferenzbeitrag Inproceedings 2021
15Michl, Jakob ; Grill, Alexander ; Waldhör, Dominic ; Schleich, Christian ; Knobloch, Theresia ; Ioannidis, E. ; Enichlmair, H. ; Minixhofer, R. ; Kaczer, Ben ; Parvais, Bertrand ; Govoreanu, Bogdan ; Radu, I ; Grasser, Tibor ; Waltl, Michael Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOSKonferenzbeitrag Inproceedings 2021
16Tselios, Konstantinos ; Waldhör, Dominic ; Stampfer, Bernhard ; Michl, Jakob ; Ioannidis, Eleftherios ; Enichlmair, H. ; Grasser, Tibor ; Waltl, Michael On the Distribution of Single Defect Threshold Voltage Shifts in SiON TransistorsArtikel Article 2021
17Schleich, Christian ; Waldhoer, Dominic ; Waschneck, Katja ; Feil, Maximilian W. ; Reisinger, Hans ; Grasser, Tibor ; Waltl, Michael Physical Modeling of Charge Trapping in 4H-SiC DMOSFET TechnologiesArtikel Article 2021
18Waldhoer, Dominic ; Schleich, Christian ; Michl, Jakob ; Stampfer, Bernhard ; Tselios, Konstantinos ; Ioannidis, Eleftherios G. ; Enichlmair, Hubert ; Waltl, Michael ; Grasser, Tibor Toward Automated Defect Extraction From Bias Temperature Instability MeasurementsArtikel Article 2021
19Jech, Markus ; El-Sayed, Al-Moatasem ; Tyaginov, Stanislav ; Waldhör, Dominic ; Bouakline, Foudhil ; Saalfrank, Peter ; Jabs, Dominic ; Jungemann, Christoph ; Waltl, Michael ; Grasser, Tibor Quantum Chemistry Treatment of Silicon-Hydrogen Bond Rupture by Nonequilibrium Carriers in Semiconductor DevicesArtikel Article 2021
20Franco, J. ; Marneffe, J.-F. ; Vandooren, Anne ; Kimura, Y ; Nyns, L ; Wu, Zhicheng ; El-Sayed, Al-Moatasem ; Jech, Markus ; Waldhör, Dominic ; Claes, Dieter ; Arimura, H ; Ragnarsson, L. A. ; Afanas´Ev, V. ; Horiguchi, N. ; Linten, D ; Grasser, Tibor ; Kaczer, Ben Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO<sub>2</sub> with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier StackingKonferenzbeitrag Inproceedings 2021

Contributing Publications Mitbeteiligte Publikationen

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Benzer Anna - 2023 - Density Functional Theory DFT Investigation of Novel...pdf.jpgBenzer, Anna Density functional theory (DFT) Iinvestigation of novel materials for application in sensingThesis Hochschulschrift 2023