Name Card

Full name Familienname, Vorname
Wimmer, Yannick Benedikt
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 30 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Wimmer, Yannick ; Waltl, Michael ; Grasser, Tibor Atomistic Modeling of Oxide DefectsBuchbeitrag Book Contribution 2020
2Waldhoer, D. ; Wimmer, Y. ; El-Sayed, A. M. ; Goes, W. ; Waltl, M. ; Grasser, T. Minimum Energy Paths for Non-Adiabatic Charge Transitions in Oxide DefectsKonferenzbeitrag Inproceedings 2019
3Goes, W. ; Wimmer, Y. ; El-Sayed, A.-M. ; Rzepa, G. ; Jech, M. ; Shluger, A.L. ; Grasser, T. Identification of Oxide Defects in Semiconductor Devices: A Systematic Approach Linking DFT to Rate Equations and Experimental EvidenceArtikel Article 2018
4Wimmer Yannick - 2017 - Hydrogen related defects in amorphous SiO2 and the...pdf.jpgWimmer, Yannick Hydrogen related defects in amorphous SiO2 and the negative bias temperature instabilityThesis Hochschulschrift 2017
5Wimmer, Yannick ; El-Sayed, Al-Moatasem ; Gös, Wolfgang ; Grasser, Tibor ; Shluger, Alexander L. Role of hydrogen in volatile behaviour of defects in SiO₂-based electronic devicesArtikel Article Jun-2016
6Grasser, T. ; Waltl, M. ; Rzepa, G. ; Goes, W. ; Wimmer, Y. ; El-Sayed, A.-M. ; Shluger, A. L. ; Reisinger, H. ; Kaczer, B. The “permanent” component of NBTI revisited: Saturation, degradation-reversal, and annealingKonferenzbeitrag Inproceedings2016
7Sharma, Prateek ; Tyaginov, Stanislav ; Jech, Markus ; Wimmer, Yannick ; Rudolf, Florian ; Enichlmair, Hubert ; Park, Jong-Mun ; Ceric, Hajdin ; Grasser, Tibor The Role of Cold Carriers and the Multiple-Carrier Process of Si-H Bond Dissociation for Hot-Carrier Degradation in n- and p-channel LDMOS DevicesArtikel Article 2016
8Grasser, T. ; Waltl, M. ; Wimmer, Y. ; Goes, W. ; Kosik, R. ; Rzepa, G. ; Reisinger, H. ; Pobegen, G. ; El-Sayed, A. ; Shluger, A. ; Kaczer, B. Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: From single defects to lifetimesKonferenzbeitrag Inproceedings 2015
9Sharma, Prateek ; Tyaginov, Stanislav ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Bina, Markus ; Enichlmair, Hubert ; Park, Jong-Mun ; Ceric, Hajdin ; Grasser, Tibor Predictive and efficient modeling of hot-carrier degradation in nLDMOS devicesKonferenzbeitrag Inproceedings2015
10Kaczer, B. ; Franco, J. ; Cho, M. ; Grasser, T. ; Roussel, Ph. J. ; Tyaginov, S. ; Bina, M. ; Wimmer, Y. ; Procel, L. M. ; Trojman, L. ; Crupi, F. ; Pitner, G. ; Putcha, V. ; Weckx, P. ; Bury, E. ; Ji, Z. ; De Keersgieter, A. ; Chiarella, T. ; Horiguchi, N. ; Groeseneken, G. ; Thean, A. Origins and implications of increased channel hot carrier variability in nFinFETsKonferenzbeitrag Inproceedings2015
11Sharma, Prateek ; Tyaginov, Stanislav ; Wimmer, Yannick ; Rudolf, Florian ; Enichlmair, Hubert ; Park, Jong-Mun ; Ceric, Hajdin ; Grasser, Tibor A model for hot-carrier degradation in nLDMOS transistors based on the exact solution of the Boltzmann transport equation versus the drift-diffusion schemeKonferenzbeitrag Inproceedings2015
12Sharma, Prateek ; Tyaginov, S. E. ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Enichlmair, H. ; Park, J.M. ; Ceric, Hajdin ; Grasser, Tibor Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETsKonferenzbeitrag Inproceedings2015
13Wimmer, Yannick ; Gös, Wolfgang ; El-Sayed, Al-Moatasem ; Shluger, A. L. ; Grasser, Tibor On the Validity of the Harmonic Potential Energy Surface Approximation for Nonradiative Multiphonon Charge Transitions in Oxide DefectsKonferenzbeitrag Inproceedings 2015
14Tyaginov, Stanislav ; Bina, Markus ; Franco, Jacopo ; Wimmer, Yannick ; Kaczer, Ben ; Grasser, Tibor On the Importance of Electron-Electron Scattering for Hot-Carrier DegradationArtikel Article 2015
15Sharma, P. ; Tyaginov, S. ; Wimmer, Y. ; Rudolf, F. ; Rupp, K. ; Enichlmair, H. ; Park, J.-M. ; Ceric, H. ; Grasser, T. Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETsArtikel Article 2015
16Sharma, Prateek ; Tyaginov, S. E. ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Bina, Markus ; Enichlmair, H. ; Park, J.M. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport EquationArtikel Article 2015
17El-Sayed, Al-Moatasem ; Wimmer, Yannick ; Goes, Wolfgang ; Grasser, Tibor ; Afanas'ev, Valery V. ; Shluger, Alexander L. Theoretical Models of Hydrogen-Induced Defects in Amorphous Silicon DioxideArtikel Article 2015
18Wimmer, Y. ; Goes, W. ; El-Sayed, A.-M. ; Shluger, A.L. ; Grasser, T. A density-functional study of defect volatility in amorphous silicon dioxideKonferenzbeitrag Inproceedings2015
19Grasser, T. ; Waltl, M. ; Goes, W. ; Wimmer, Y. ; El-Sayed, Al-Moatasem Bellah ; Shluger, A.L. ; Kaczer, B. On the volatility of oxide defects: Activation, deactivation, and transformationKonferenzbeitrag Inproceedings2015
20Rudolf, Florian ; Wimmer, Yannick ; Weinbub, Josef ; Rupp, Karl ; Selberherr, Siegfried Mesh Generation Using Dynamic Sizing FunctionsKonferenzbeitrag Inproceedings2014

Contributing Publications Mitbeteiligte Publikationen

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Waldhoer Dominic - 2018 - Potential energy surface approximations for...pdf.jpgWaldhör, Dominic Potential energy surface approximations for nonradiative multiphonon charge transitions in oxide defectsThesis Hochschulschrift 2018