Record link: 
http://hdl.handle.net/20.500.12708/212514
-
Title: 
Evaluation of the Robustness of the Defect-Centric Model for Defect Parameter Extraction from RTN Analysis
en
Citation: 
Loesener, M., Zinsler, T., Stampfer, B., Wimmer, F., Ioannidis, E., Monga, U., Pflanzl, W., Minixhofer, R., Grasser, T., & Waltl, M. (2024). Evaluation of the Robustness of the Defect-Centric Model for Defect Parameter Extraction from RTN Analysis. In M. Waltl, F. F. Huemer, & M. Hofbauer (Eds.), 2024 Austrochip Workshop on Microelectronics (Austrochip). IEEE. https://doi.org/10.1109/Austrochip62761.2024.10716231
-
Publisher DOI: 
10.1109/Austrochip62761.2024.10716231
-
Publication Type: 
Inproceedings - Full-Paper Contribution
en
Language: 
English
-
Authors: 
Loesener, Martin 
Zinsler, Tobias 
Stampfer, Bernhard 
Wimmer, Florian 
Ioannidis, Eleftherios 
Monga, Udit 
Pflanzl, Walter 
Minixhofer, Rainer 
Grasser, Tibor 
Waltl, Michael 
-
Organisational Unit: 
E360-01 - Forschungsbereich Mikroelektronik 
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials 
-
Published in: 
2024 Austrochip Workshop on Microelectronics (Austrochip) 
-
ISBN: 
979-8-3315-1617-8
-
Date (published): 
2024
-
Event name: 
2024 Austrochip Workshop on Microelectronics (Austrochip) 
en
Event date: 
25-Sep-2024 - 26-Sep-2024
-
Event place: 
Vienna, Austria
-
Number of Pages: 
4
-
Publisher: 
IEEE, Vienna, Austria
-
Keywords: 
Transistor Reliability; Modeling; Noise in Semiconductor Devices; Charge Trapping
en
Project title: 
CD-Labor für Einzeldefektspektroskopie in Halbleiterbauelementen: 00000000 (Christian Doppler Forschungsgesells) 
-
Research Areas: 
Modeling and Simulation: 50%
Computational Materials Science: 50%
-
Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
-
Appears in Collections:
Conference Paper

Show full item record

Page view(s)

102
checked on Feb 18, 2025

Download(s)

5
checked on Feb 18, 2025

Google ScholarTM

Check