Record link: 
http://hdl.handle.net/20.500.12708/223231
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Title: 
Investigation of sub-nm binary oxidic surface modifications on mixed ionic electronic conductors with ToF-SIMS: Oxidic overlayer stability and ionic interdiffusion behavior
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Citation: 
Fahrnberger, F., Siebenhofer, M., Hahn, M., Sauer, M., Foelske, A., Friedbacher, G., Kubicek, M., & Hutter, H. (2024). Investigation of sub-nm binary oxidic surface modifications on mixed ionic electronic conductors with ToF-SIMS: Oxidic overlayer stability and ionic interdiffusion behavior. In SIMS24 : Abstract Book (pp. 179–179).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Fahrnberger, Florian 
Siebenhofer, Matthäus 
Hahn, Michael 
Sauer, M. 
Foelske, Annette 
Friedbacher, Gernot 
Kubicek, Markus 
Hutter, H. 
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Organisational Unit: 
E057-05 - Fachbereich Analytical Instrumentation Center 
E057-04 - Fachbereich Röntgenzentrum 
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie 
E164-04-3 - Forschungsgruppe Festkörperionik 
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials 
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Published in: 
SIMS24 : Abstract Book 
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Date (published): 
8-Sep-2024
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Event name: 
24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24) 
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Event date: 
8-Sep-2024 - 13-Sep-2024
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Event place: 
La Rochelle, France
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Number of Pages: 
1
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Keywords: 
ToF-SIMS; Mixed ionic electronic oxides; Oxidic decorations; Secondary ion formation; Surface-near dipoles
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Research facilities: 
Analytical Instrumentation Center 
Röntgenzentrum 
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Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 50%
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Science Branch: 
1040 - Chemie: 100%
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Appears in Collections:
Conference Paper

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