Record link: 
http://hdl.handle.net/20.500.12708/224427
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Title: 
Insights from Hysteresis Analysis in 2D MOSFETs
en
Citation: 
Waldhör, D., Karl, A., Verdianu, A., Bahrami, M., Knobloch, T., & Grasser, T. (2025, October). Insights from Hysteresis Analysis in 2D MOSFETs [Conference Presentation]. IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, United States of America (the). http://hdl.handle.net/20.500.12708/224427
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Publication Type: 
Presentation - Conference Presentation
en
Language: 
English
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Authors: 
Waldhör, Dominic 
Karl, Alexander 
Verdianu, Axel 
Bahrami, Mina 
Knobloch, Theresia 
Grasser, Tibor 
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Organisational Unit: 
E360-01 - Forschungsbereich Mikroelektronik 
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Date (published): 
Oct-2025
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Event name: 
IEEE International Integrated Reliability Workshop (IIRW) 
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Event date: 
5-Oct-2025 - 9-Oct-2025
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Event place: 
South Lake Tahoe, United States of America (the)
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Keywords: 
2D materials; reliability; hysteresis
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Research facilities: 
Vienna Scientific Cluster 
Zentrum für Mikro & Nanostrukturen 
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Project title: 
Fluoride für die nächste Generation von 2D Nanoelektronik: 101021351 (European Commission) 
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Research Areas: 
Nanoelectronics: 40%
Modeling and Simulation: 60%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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