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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Tyaginov, S.E. ; Jech, M. ; Rzepa, G. ; Grill, A. ; El-Sayed, A.-M. ; Pobegen, G. ; Makarov, A. ; Grasser, T. | Border Trap Based Modeling of SiC Transistor Transfer Characteristics | Konferenzbeitrag Inproceedings  | 2018 |
| 2 | | Waltl, Michael | Characterization and Modeling of Single Charge Trapping in MOS Transistors | Konferenzbeitrag Inproceedings | 2019 |
| 3 | | Vandemaele, Michiel ; Kaczer, Ben ; Stanojevic, Zlatan ; Tyaginov, Stanislav ; Makarov, Alexander ; Chasin, Adrian ; Mertens, Hans ; Linten, Dimitri ; Groeseneken, Guido | Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs | Konferenzbeitrag Inproceedings | 2018 |
| 4 | | Tselios, K. ; Stampfer, B. ; Michl, J. ; Ioannidis, E. ; Enichlmair, H. ; Waltl, M. | Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors | Konferenzbeitrag Inproceedings | 2020 |
| 5 | | Scharlotta, Jean-Yean ; Bersuker, Gennadi ; Tyaginov, S. E. ; Young, Chadwing ; Haase, Gaddi ; Rzepa, Gerhard ; Waltl, Michael ; Chohan, Talha ; Iyer, Subramanian ; Kotov, Alexander ; Zambelli, Cristian ; Guarin, Fernando ; Puglisi, Francesco Maria ; Ostermaier, C | IIRW 2019 Discussion Group II: Reliability for Aerospace Applications | Konferenzbeitrag Inproceedings | 2019 |
| 6 | | Waldhoer, D. ; Wimmer, Y. ; El-Sayed, A. M. ; Goes, W. ; Waltl, M. ; Grasser, T. | Minimum Energy Paths for Non-Adiabatic Charge Transitions in Oxide Defects | Konferenzbeitrag Inproceedings | 2019 |
| 7 | | Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado | Modeling Plasma-Induced Damage During the Dry Etching of Silicon | Inproceedings Konferenzbeitrag | 9-Oct-2022 |
| 8 | | Vasilev, Alexander ; Jech, Markus ; Grill, Alexander ; Rzepa, Gerhard ; Schleich, Christian ; Makarov, Alexander ; Pobegen, Gregor ; Grasser, Tibor ; Waltl, Michael ; Tyaginov, Stanislav | Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors | Konferenzbeitrag Inproceedings | 2020 |
| 9 | | Makarov, Alexander ; Roussel, Philippe ; Bury, Erik ; Vandemaele, Michiel ; Spessot, Alessio ; Linten, Dimitri ; Kaczer, Ben ; Tyaginov, Stanislav | On Correlation between Hot-Carrier Stress Induced Device Parameter Degradation and Time-Zero Variability | Konferenzbeitrag Inproceedings | 2019 |
| 10 | | Kaczer, Ben ; Amoroso, S. M. ; Hussin, Razaidi ; Asenov, A ; Franco, J. ; Weckx, P. ; Roussel, Ph. J. ; Rzepa, Gerhard ; Grasser, Tibor ; Horiguchi, N. | On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects | Konferenzbeitrag Inproceedings | 2016 |
| 11 | | Tyaginov, S.E. ; Makarov, A. ; Jech, M. ; Franco, J. ; Sharma, P. ; Kaczer, B. ; Grasser, T. | On the effect of interface traps on the carrier distribution function during hot-carrier degradation | Konferenzbeitrag Inproceedings | 2016 |
| 12 | | Franco, J. ; Wu, Z. ; Rzepa, G. ; Ragnarsson, L.-A ; Dekkers, H. ; Vandooren, A. ; Groeseneken, G. ; Horiguchi, N. ; Collaert, N. ; Linten, D. ; Grasser, T. ; Kaczer, B. | On the Impact of the Gate Metal Work-Function on the Charge Trapping Component of BTI | Konferenzbeitrag Inproceedings | 2018 |
| 13 | | Tyaginov, S. ; Jech, M. ; Sharma, P. ; Franco, J. ; Kaczer, B. ; Grasser, T. | On the temperature behavior of hot-carrier degradation | Konferenzbeitrag Inproceedings | 2015 |
| 14 | | Filipovic, Lado | Reliability of Platinum Microheater Geometries for MEMS-Based Gas Sensors | Inproceedings Konferenzbeitrag | 2022 |
| 15 | | Stampfer, B. ; Simicic, M. ; Weckx, P. ; Abbasi, A. ; Kaczer, B. ; Grasser, T. ; Waltl, M. | Statistical Characterization of BTI and RTN using Integrated pMOS Arrays | Konferenzbeitrag Inproceedings | 2019 |
| 16 | | Puschkarsky, Katja ; Reisinger, H. ; Aichinger, T. ; Gustin, W. ; Grasser, Tibor | Threshold Voltage Hysteresis in SiC MOSFETs and Its Impact on Circuit Operation | Konferenzbeitrag Inproceedings | 2017 |
