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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Palankovski, Vassil ; Kuzmik, Jan | A Promising New n<sup>++</sup>-GaN/InAlN/GaN HEMT Concept for High-Frequency Applications | Buchbeitrag Book Contribution | 2012 |
| 2 | | Wittmann, Robert ; Uppal, Suresh ; Hoessinger, Andreas ; Cervenka, Johann ; Selberherr, Siegfried | A Study of Boron Implantation into High Ge Content SiGe Alloys | Buchbeitrag Book Contribution | 2006 |
| 3 | | Karamitaheri, Hossein ; Pourfath, Mahdi ; Faez, Rahim ; Kosina, Hans | An Investigation of the Geometrical Effects on the Thermal Conductivity of Graphene Antidot Lattices | Buchbeitrag Book Contribution | 2011 |
| 4 | | Orio, Roberto ; Carniello, Sara ; Ceric, Hajdin ; Selberherr, Siegfried | Analysis of Electromigration in Dual-Damascene Interconnect Structures | Konferenzbeitrag Inproceedings | 2008 |
| 5 | | Karlowatz, Gerhard ; Ungersböck, Stephan Enzo ; Wessner, Wilfried ; Kosina, Hans ; Selberherr, Siegfried | Analysis of Hole Transport in Arbitrarily Strained Germanium | Buchbeitrag Book Contribution | 2006 |
| 6 | | de Orio, R. L. ; Ceric, H. ; Selberherr, Siegfried | Analysis of Resistance Change Development Due to Voiding in Copper Interconnects Ended by A Through Silicon Via | Konferenzbeitrag Inproceedings  | 2012 |
| 7 | | Osintsev, Dmitri S. ; Sverdlov, Viktor ; Makarov, Alexander ; Selberherr, Siegfried | Ballistic Transport Properties of Spin Field-Effect Transistors Built on Silicon and InAs Fins | Konferenzbeitrag Inproceedings | 2011 |
| 8 | | Wang, Lei ; Merkle, Rotraut ; Baumann, Frank S. ; Fleig, Jürgen ; Maier, Joachim | (BaxSr1-x)(CoyFe1-y)O3-δ Perovskites as SOFC Cathode Material: Electrode-Electrolyte Reactions and Electrochemical Characterisation | Konferenzbeitrag Inproceedings | 2007 |
| 9 | | Grasser, Tibor ; Goes, Wolfgang ; Kaczer, Ben | Critical Modeling Issues in Negative Bias Temperature Instability | Buchbeitrag Book Contribution | 2009 |
| 10 | | Palankovski, Vassil ; Donnarumma, Gesualdo ; Kuzmik, Jan | Degradation Study of Single and Double-Heterojunction InAlN/GaN HEMTs by Two-Dimensional Simulation | Buchbeitrag Book Contribution | 2012 |
| 11 | | Karner, Markus ; Gehring, Andreas ; Holzer, Stefan ; Kosina, Hans ; Selberherr, Siegfried | Efficient Calculation of Lifetime Based Direct Tunneling Through Stacked Dielectrics | Buchbeitrag Book Contribution | 2006 |
| 12 | | Filipovic, Lado ; Selberherr, Siegfried | Electric Field Based Simulations of Local Oxidation Nanolithography Using Atomic Force Microscopy in a Level Set Environment | Konferenzbeitrag Inproceedings | 2012 |
| 13 | | Ceric, Hajdin ; Selberherr, Siegfried | Electromigration Modeling for Interconnect Structures in Microelectronics | Konferenzbeitrag Inproceedings | 2007 |
| 14 | | Kotomin, Eugene A. ; Mastrikov, Yuri ; Heifets, Eugene ; Merkle, Rotraut ; Fleig, Jurgen ; Maier, Joachim ; Gordon, Alexander ; Felsteiner, Joshua | First-Principles Modeling of LaMnO3 SOFC Cathode Material | Konferenzbeitrag Inproceedings | 2008 |
| 15 | | Sverdlov, Viktor ; Baumgartner, Oskar ; Windbacher, Thomas ; Schanovsky, Franz ; Selberherr, Siegfried | Impact of Confinement and Stress on the Subband Parameters in Ultra-Thin Silicon Films | Konferenzbeitrag Inproceedings | 2009 |
| 16 | | Fiorentini, Simone ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Ender, Johannes ; Goes, Wolfgang ; Sverdlov, Viktor | Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAM | Buchbeitrag Book Contribution | 2020 |
| 17 | | Opitz, Alexander K. ; Schintlmeister, Arno ; Hutter, Herbert ; Fleig, Juergen | Investigation of the Oxygen Exchange Reaction on Pt/YSZ: The Relation between Three Phase Boundaries and Electrode Performance | Konferenzbeitrag Inproceedings | 2009 |
| 18 | | Goes, Wolfgang ; Schanovsky, Franz ; Hehenberger, Philipp ; Wagner, Paul-Juergen ; Grasser, Tibor | (Invited) Charge Trapping and the Negative Bias Temperature Instability | Buchbeitrag Book Contribution | 2010 |
| 19 | | Knobloch, Theresia ; Rzepa, Gerhard ; Illarionov, Yury Yuryevich ; Waltl, Michael ; Polyushkin, Dmitry ; Pospischil, Andreas ; Furchi, Marco ; Mueller, Thomas ; Grasser, Tibor | (Invited) Impact of Gate Dielectrics on the Threshold Voltage in MoS<sub>2</sub>Transistors | Buchbeitrag Book Contribution | 2017 |
| 20 | | Fleig, Jürgen ; Kubicek, Markus ; Huber, Stefanie ; Ahrens, Martin ; Langer-Hansel, Katharina ; Gerstl, Matthias ; Hutter, Herbert | (invited) Ion Transfer and Ion Transport in Thin Films Investigated by Complementary Tracer Diffusion and Impedance Spectroscopy Measurements | Konferenzbeitrag Inproceedings | 2012 |
