2015 IEEE International Reliability Physics Symposium

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Book title Buchtitel
2015 IEEE International Reliability Physics Symposium
 
Publisher Herausgeber
IEEE
 

Publications Publikationen

Results 1-6 of 6 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Illarionov, Yu. Yu. ; Waltl, M. ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Mueller, T. ; Lemme, M.C. ; Grasser, T. Hot-carrier degradation in single-layer double-gated graphene field-effect transistorsKonferenzbeitrag Inproceedings2015
2Franco, Jacopo ; Kaczer, Ben ; Roussel, Philippe J. ; Bury, Erik ; Mertens, Hans ; Ritzenthaler, Romain ; Grasser, Tibor ; Horiguchi, Naoto ; Thean, Aaron ; Groeseneken, Guido NBTI in Si<inf>0.55</inf>Ge<inf>0.45</inf> cladding p-FinFETs: Porting the superior reliability from planar to 3D architecturesKonferenzbeitrag Inproceedings2015
3Grasser, T. ; Waltl, M. ; Goes, W. ; Wimmer, Y. ; El-Sayed, A.-M. ; Shluger, A.L. ; Kaczer, B. On the volatility of oxide defects: Activation, deactivation, and transformationKonferenzbeitrag Inproceedings2015
4Kaczer, B. ; Franco, J. ; Cho, M. ; Grasser, T. ; Roussel, Ph. J. ; Tyaginov, S. ; Bina, M. ; Wimmer, Y. ; Procel, L. M. ; Trojman, L. ; Crupi, F. ; Pitner, G. ; Putcha, V. ; Weckx, P. ; Bury, E. ; Ji, Z. ; De Keersgieter, A. ; Chiarella, T. ; Horiguchi, N. ; Groeseneken, G. ; Thean, A. Origins and implications of increased channel hot carrier variability in nFinFETsKonferenzbeitrag Inproceedings2015
5Suhir, E. ; Bensoussan, A. ; Khatibi, G. ; Nicolics, J. Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challengesKonferenzbeitrag Inproceedings2015
6Lagger, Peter Willibald ; Donsa, Stefan ; Spreitzer, P. ; Pobegen, G. ; Reiner, Maria ; Naharashi, H. ; Mohamed, J. ; Mösslacher, M. ; Prechtl, G. ; Pogany, Dionyz ; Ostermaier, C Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heatersKonferenzbeitrag Inproceedings2015