Workshop on Dielectrics in Microelectronics (WODIM)

Event name
Workshop on Dielectrics in Microelectronics (WODIM)
 
Event type
Event for scientific audience
 
Start date
26-06-2006
End date
28-06-2006
 
Location
Catania
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-19 of 19 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Semenov, Alexander ; Dedyk, A. I. ; Belavsky, P. Y. ; Pavlova, Yu. V. ; Karmanenko, Sergey ; Pakhomov, Oleg ; Starkov, Alexander ; Starkov, Ivan A Study of Ferroelectric Multilayer Structures Based on BST Films Containing High Concentration of Magnetic IonsKonferenzbeitrag Inproceedings2012
2Holzer, Stefan ; Sheikholeslami, Alireza ; Karner, Markus ; Grasser, Tibor Comparison of Deposition Models for TEOS CVD ProcessKonferenzbeitrag Inproceedings 2006
3Ostermaier, Clemens ; Lagger, Peter Willibald ; Reiner, Maria ; Koller, Christian ; Pobegen, Gregor ; Pogany, Dionyz Dielectrics for GaN and GaN as dielectric: The role of interface and bulk defectsPräsentation Presentation2018
4Bethge, Ole ; Abermann, Stephan ; Henkel, Christoph ; Bertagnolli, Emmerich Electrical characteristics of ALD Al2O3/ZrO2/Al2O3 high-k dielectric stacksKonferenzbeitrag Inproceedings2008
5Tyaginov, S. E. ; Vexler, M.I. ; El Hdiy, A. ; Gacem, K. ; Zaporojtchenko, V. Electrical Methods for Estimating the Correlation Length of Insulator Thickness Fluctuations in MIS Tunnel StructuresKonferenzbeitrag Inproceedings2008
6Henkel, Christoph ; Abermann, Stephan ; Bethge, Ole ; Pozzovivo, Gianmauro ; Bertagnolli, Emmerich Ge SB-p-MOSFET with ALD ZrO2/La2 O3 DielectricsPräsentation Presentation2010
7Starkov, Ivan ; Tyaginov, S. E. ; Enichlmair, H. ; Triebl, Oliver ; Cervenka, Johann ; Jungemann, C. ; Carniello, Sara ; Park, Jong Mun ; Ceric, Hajdin ; Grasser, Tibor HC Degradation Model: Interface State Profile-Simulations vs. ExperimentKonferenzbeitrag Inproceedings2010
8Henkel, Christoph ; Abermann, Stephan ; Bethge, Ole ; Bertagnolli, Emmerich Impact of ALD deposition of platinum films on high-k dielectric materialsPräsentation Presentation2008
9Abermann, Stephan ; Bethge, Ole ; Henkel, Christoph ; Bertagnolli, Emmerich Investigation of conductance- and trapping-characteristics of Al2O3/ZrO2/Al2O3 high-k gate oxidesKonferenzbeitrag Inproceedings2008
10Starkov, Ivan ; Enichlmair, H. ; Grasser, Tibor Local Oxide Capacitance as a Crucial Parameter for Characterization of Hot-Carrier Degradation in High-Voltage n-MOSFETKonferenzbeitrag Inproceedings2012
11Makarov, Alexander ; Sverdlov, Viktor ; Selberherr, Siegfried Modeling of Resistive Switching in RRAM Using Monte Carlo SimulationsKonferenzbeitrag Inproceedings2010
12Schanovsky, Franz ; Gös, Wolfgang ; Grasser, Tibor Mulit-Phonon Hole-Trapping from First-PrinciplesKonferenzbeitrag Inproceedings2010
13Entner, Robert ; Grasser, Tibor ; Enichlmair, H. ; Minixhofer, R. Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress TemperaturesKonferenzbeitrag Inproceedings 2006
14Cico, Karol ; Kuzmik, Jan ; Gregusova, Dagmar ; Lalinsky, T. ; Pogany, Dionyz ; Fröhlich, Karol Optimization and performance of Al2O3/GaN metal-oxide-semiconductor structuresKonferenzbeitrag Inproceedings2006
15Grasser, Tibor Oxide Defects in MOS Transistors: Characterization and ModelingPräsentation Presentation2015
16Kaczer, Ben ; Grasser, Tibor ; Franco, J. ; Toledano-Luque, M. ; Roussel, Ph. J. ; Groeseneken, G. Recent Trends in Bias Temperature InstabilityKonferenzbeitrag Inproceedings2010
17Toledano-Luque, M. ; Kaczer, Ben ; Roussel, Ph. J. ; Grasser, Tibor ; Groeseneken, G. Temperature Dependence of the Emission and Capture Times of SiON Individual Traps after Positive Bias Temperature StressKonferenzbeitrag Inproceedings2010
18Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan Thermodynamic Foundations of Solid-State Cooler Based on Multiferroic MaterialsKonferenzbeitrag Inproceedings2012
19Karner, Markus ; Gehring, Andreas ; Wagner, Martin ; Entner, Robert ; Holzer, Stefan ; Gös, Wolfgang ; Vasicek, Martin ; Grasser, Tibor ; Kosina, Hans ; Selberherr, Siegfried VSP-A Gate Stack AnalyzerKonferenzbeitrag Inproceedings2006