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| | Preview | Author(s) | Title | Type | Issue Date |
| 81 | | Steinhäußer, Frank ; Talai, Armin ; Sandulache, Gabriela ; Weigel, Robert ; Koelpin, Alexander ; Hansal, Wolfgang ; Bittner, Achim ; Schmid, Ulrich | Pulse plated silver metallization on porosified LTCC substrates for high frequency applications | Artikel Article  | 2016 |
| 82 | | Polzer, Thomas ; Huemer, Florian ; Steininger, Andreas | Refined Metastability Characterization Using a Time-to-Digital Converter | Artikel Article | 2018 |
| 83 | | Aichinger, Thomas ; Nelhiebel, Michael ; Grasser, Tibor | Refined NBTI Characterization of Arbitrarily Stressed PMOS Devices at Ultra-low and Unique Temperatures | Artikel Article | 2013 |
| 84 | | Ender, Johannes ; Lacerda de Orio, Roberto ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor | Reinforcement learning to reduce failures in SOT-MRAM switching | Artikel Article | 2022 |
| 85 | | Ostermaier, Clemens ; Lagger, Peter ; Alomari, Mohammed ; Herfurth, Patrick ; Maier, David ; Alexewicz, Alexander ; Forte-Poisson, Marie-Antoinette di ; Delage, Sylvain L. ; Strasser, Gottfried ; Pogany, Dionyz ; Kohn, Erhard | Reliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structure | Artikel Article | 2012 |
| 6 | | Mazloum Nejadari, Ali ; Khatibi, Golta ; Czerny, Bernhard ; Lederer, Martin ; Nicolics, Johann ; Weiss, Laurenz | Reliability of Cu wire bonds in microelectronic packages | Artikel Article | 2017 |
| 7 | | Ostermaier, C. ; Lagger, P. ; Reiner, M. ; Pogany, D. | Review of bias-temperature instabilities at the III-N/dielectric interface | Artikel Article | 2018 |
| 8 | | Waltl, Michael ; Stampfer, Bernhard ; Rzepa, Gerhard ; Kaczer, Ben ; Grasser, Tibor | Separation of Electron and Hole Trapping Components of PBTI in SiON nMOS Transistors | Artikel Article | 2020 |
| 9 | | Podgaynaya, Alevtina ; Rudolf, R ; Elattari, B ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias ; Strasser, Gottfried | Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization | Artikel Article | 2010 |
| 10 | | Shah, Ambika Prasad ; Rossi, Daniele ; Sharma, Vishal ; Vishvakarma, Santosh Kumar ; Waltl, Michael | Soft Error Hardening Enhancement Analysis of NBTI Tolerant Schmitt Trigger Circuit | Artikel Article | 2020 |
| 11 | | Ceric, Hajdin ; Lacerda de Orio, Roberto ; Selberherr, Siegfried | Statistical Study of Electromigration in Gold Interconnects | Article Artikel | Aug-2023 |
| 12 | | Fleury, Clément ; Zhytnytska, Rimma ; Bychikhin, Sergey ; Cappriotti, Mattia ; Hilt, Oliver ; Visalli, Domenica ; Meneghesso, Gaudenzio ; Zanoni, Enrico ; Würfl, Joachim ; Derluyn, Joff ; Strasser, Gottfried ; Pogany, Dionyz | Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications | Artikel Article | 2013 |
| 13 | | Grasser, Tibor | Stochastic Charge Trapping in Oxides: From Random Telegraph Noise to Bias Temperature Instabilities | Artikel Article | 2012 |
| 14 | | Padovan, Valeria ; Koller, C. ; Pobegen, G. ; Ostermaier, C. ; Pogany, D. | Stress and Recovery Dynamics of Drain Current in GaN HD-GITs Submitted to DC Semi-ON stress | Artikel Article | 2019 |
| 15 | | Singulani, A.P. ; Ceric, H. ; Selberherr, S. | Stress Evolution in the Metal Layers of TSVs with Bosch Scallops | Artikel Article | 2013 |
| 16 | | Filipovic, Lado ; Selberherr, Siegfried | Stress in Three-Dimensionally Integrated Sensor Systems | Artikel Article | 2016 |
| 17 | | Stadler, Wolfgang ; Esmark, Kai ; Reynders, K ; Zubeidat, M ; Graf, M. ; Wilkening, W ; Willemen, Joost ; Qu, N ; Mettler, S ; Etherton, M ; Nuernbergk, D ; Wolf, H ; Gieser, H. ; Soppa, W. ; Heyn, V.De ; Natarajan, M ; Groeseneken, G. ; Morena, E ; Stella, R ; Andreini, A. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich ; Foss, C ; Konrad, A ; Frank, M | Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stages | Artikel Article | 2005 |
| 18 | | Stabentheiner, Manuel ; Diehle, Patrick ; Altmann, F. ; Hübner, S. ; Lejoyeux, M. ; Taylor, A.A. ; Wieland, D. ; Pogany, D. ; Ostermaier, Clemens | Test concept for a direct correlation between dislocations and the intrinsic degradation of lateral PIN diodes in GaN-on-Si under reverse bias | Article Artikel | Nov-2023 |
| 19 | | Filipovic, Lado ; Selberherr, Siegfried | The Effects of Etching and Deposition on the Performance and Stress Evolution of Open Through Silicon Vias | Artikel Article | 2014 |
| 20 | | Filipovic, Lado | Theoretical Examination of Thermo-Migration in Novel Platinum Microheaters | Artikel Article | 2021 |
