|
| | Preview | Author(s) | Title | Type | Issue Date |
| 41 | | Notermans, Guido ; Bychikhin, Sergey ; Pogany, Dionyz ; Johnsson, David ; Maksimovic, Dejan | HMM-TLP correlation for system-efficient ESD design | Artikel Article | 2012 |
| 42 | | Heer, M. ; Grombach, P. ; Heid, A. ; Pogany, D. | Hot spot analysis during thermal shutdown of SOI BCDMOS half bridge driver for automotive applications | Artikel Article | 2008 |
| 43 | | Goes, W. ; Wimmer, Y. ; El-Sayed, A.-M. ; Rzepa, G. ; Jech, M. ; Shluger, A.L. ; Grasser, T. | Identification of Oxide Defects in Semiconductor Devices: A Systematic Approach Linking DFT to Rate Equations and Experimental Evidence | Artikel Article  | 2018 |
| 44 | | Abermann, Stephan ; Efavi, J ; Sjöblom, G ; Lemme, M ; Olsson, Jörgen ; Bertagnolli, Emmerich | Impact of Al-, Ni-, TiN-, and Mo-mental gates on MOCVD-grown HfO₂ and ZrO₂high-κ dielectrics | Artikel Article | 2007 |
| 45 | | Pobegen, Gregor ; Aichinger, Thomas ; Grasser, Tibor ; Nelhiebel, Michael | Impact of Gate Poly Doping and Oxide Thickness on the N- and PBTI in MOSFETs | Artikel Article | 2011 |
| 46 | | Tyaginov, Stanislav ; Sverdlov, Viktor ; Starkov, Ivan ; Gös, Wolfgang ; Grasser, Tibor | Impact of O-Si-O Bond Angle Fluctuations on the Si-O Bond-Breakage Rate | Artikel Article | 2009 |
| 47 | | Waltl, Michael ; Waldhoer, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor | Impact of Single-Defects on the Variability of CMOS Inverter Circuits | Artikel Article | 2021 |
| 48 |  | Waltl, Michael ; Waldhör, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor | Impact of single-defects on the variability of CMOS inverter circuits | Article Artikel   | Nov-2021 |
| 49 | | Köck, Helmut ; Djelassi, Christian ; Filippis, Stefano de ; Illing, Robert ; Nelhiebel, Michael ; Ladurner, Markus ; Glavanovics, Michael ; Pogany, Dionyz | Improved thermal management of low voltage power devices with optimized bond wire positions | Artikel Article | 2011 |
| 50 |  | Ender, Johannes ; Lacerda de Orio, Roberto ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, W. ; Sverdlov, Viktor | Improving failure rates in pulsed SOT-MRAM switching by reinforcement learning | Article Artikel | Nov-2021 |
| 51 | | Smetana, Walter ; Reicher, Roland ; Homolka, Heinz | Improving reliability of thick film initiators for automotive applications based on FE-analyses | Artikel Article | 2005 |
| 52 | | Schramböck, Matthias ; Andrews, Aaron Maxwell ; Roch, Tomas ; Schrenk, Werner ; Strasser, Gottfried | In-based quantum dots on AlᵪGa₁₋ᵪAs surfaces | Artikel Article | 2007 |
| 53 |  | Walter, Thomas ; Khatibi, G. ; Betzwar Kotas, A. ; Kretschy, Nicole | In-situ delamination detection in multi-layered semiconductor packages | Article Artikel | Nov-2023 |
| 54 | | Weilguni, Michael ; Smetana, Walter ; Nicolics, Johann ; Kausel, Wilfried ; Goebl, Werner | Influence of lamination parameters on mechanical properties of low temperature co-fired ceramic tapes | Artikel Article | 2011 |
| 55 | | Ceric, Hajdin ; de Orio, Roberto Lacerda ; Selberherr, Siegfried | Interconnect Reliability Dependence on Fast Diffusivity Paths | Artikel Article | 2012 |
| 56 | | Czerny, Bernhard ; Khatibi Damavandi, Golta | Interface characterization of Cu Cu ball bonds by a fast shear fatigue method | Article Artikel | Nov-2020 |
| 57 | | Czerny, B. ; Khatibi, G. | Interface characterization of Cu-Cu ball bonds by a fast shear fatigue method | Artikel Article | 2020 |
| 58 | | Czerny, B. ; Khatibi, G. | Interface reliability and lifetime prediction of heavy aluminum wire bonds | Artikel Article | 2016 |
| 59 | | Tyaginov, S. E. ; Starkov, Ivan ; Triebl, Oliver ; Cervenka, Johann ; Jungemann, C. ; Carniello, Sara ; Park, J.M. ; Enichlmair, H. ; Karner, Markus ; Kernstock, Christian ; Seebacher, E. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor | Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling | Artikel Article | 2010 |
| 60 | | Filipovic, Lado ; Singulani, Anderson Pires ; Roger, Frederic ; Carniello, Sara ; Selberherr, Siegfried | Intrinsic Stress Analysis of Tungsten-Lined Open TSVs | Artikel Article | 2015 |
