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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Tselios, Konstantinos ; Knobloch, Theresia ; Michl, Jakob Daniel ; Waldhör, Dominic ; Schleich, Christian ; Ioannidis , Eleftherios ; Enichlmair , Hubert ; Minixhofer , Rainer ; Grasser, Tibor ; Waltl, Michael | Impact of Single Defects on NBTI and PBTI Recovery in SiO₂ Transistors | Inproceedings Konferenzbeitrag  | Oct-2022 |
| 2 | | Waltl, Michael ; Hernandez, Yoanlys ; Schleich, Christian ; Waschneck, Katja ; Stampfer, Bernhard ; Reisinger, Hans ; Grasser, Tibor | Performance Analysis of 4H-SiC Pseudo-D CMOS Inverter Circuits Employing Physical Charge Trapping Models | Artikel Article | 2022 |
| 3 | | Waltl, Michael ; Hernandez, Yoanlys ; Schleich, Christian ; Waschneck, Katja Anna ; Stampfer, Bernhard ; Reisinger, H. ; Grasser, Tibor | Performance Analysis of 4H-SiC Pseudo-D CMOS Inverter Circuits Employing Physical Charge Trapping Models | Buchbeitrag Book Contribution | 2022 |
| 4 |  | Waltl, Michael ; Waldhör, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor | Impact of single-defects on the variability of CMOS inverter circuits | Article Artikel   | Nov-2021 |
| 5 | | Waldhoer, Dominic ; Schleich, Christian ; Michl, Jakob ; Stampfer, Bernhard ; Tselios, Konstantinos ; Ioannidis, Eleftherios G. ; Enichlmair, Hubert ; Waltl, Michael ; Grasser, Tibor | Toward Automated Defect Extraction From Bias Temperature Instability Measurements | Artikel Article | 2021 |
| 6 | | Knobloch, Theresia ; Illarionov, Yury Yu. ; Ducry, Fabian ; Schleich, Christian ; Wachter, Stefan ; Watanabe, Kenji ; Taniguchi, Takashi ; Mueller, Thomas ; Waltl, Michael ; Lanza, Mario ; Vexler, Mikhail I. ; Luisier, Mathieu ; Grasser, Tibor | The Performance Limits of Hexagonal Boron Nitride as an Insulator for Scaled CMOS Devices Based on Two-Dimensional Materials | Artikel Article | 2021 |
| 7 | | Michl, J. ; Grill, Alexander ; Stampfer, B. ; Waldhoer, D. ; Schleich, Christian ; Knobloch, T. ; Ioannidis, E. ; Enichlmair, H. ; Minixhofer, R. ; Kaczer, B. ; Parvais, B. ; Govoreanu, Bogdan ; Radu, I. ; Grasser, T. ; Waltl, M. | Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS | Inproceedings Konferenzbeitrag | 2021 |
| 8 | | Waltl, Michael ; Waldhoer, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor | Impact of Single-Defects on the Variability of CMOS Inverter Circuits | Artikel Article | 2021 |
| 9 | | Schleich, Christian ; Waldhoer, Dominic ; Waschneck, Katja ; Feil, Maximilian W. ; Reisinger, Hans ; Grasser, Tibor ; Waltl, Michael | Physical Modeling of Charge Trapping in 4H-SiC DMOSFET Technologies | Artikel Article | 2021 |
| 10 | | Vasilev, Alexander ; Jech, Markus ; Grill, Alexander ; Rzepa, Gerhard ; Schleich, Christian ; Makarov, Alexander ; Pobegen, Gregor ; Grasser, Tibor ; Waltl, Michael ; Tyaginov, Stanislav | Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors | Konferenzbeitrag Inproceedings | 2020 |
| 11 | | Schleich, C. ; Berens, J. ; Rzepa, G. ; Pobegen, G. ; Rescher, G. ; Tyaginov, S. ; Grasser, T. ; Waltl, M. | Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs | Konferenzbeitrag Inproceedings | 2019 |
