Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
 
Code Kennzahl
E360
 
Type of Organization Organisationstyp
Institute
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 

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Results 61-80 of 715 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
61Bendra, M. ; Fiorentini, S. ; Goes, W. ; Selberherr, S. ; Sverdlov, V. Interface Effects in Ultra-Scaled MRAM CellsArtikel Article 2022
62Illarionov, Yury Yu. ; Knobloch, Theresia ; Grasser, Tibor Inorganic Molecular Crystals for 2D ElectronicsArtikel Article 2022
63Ender, Johannes ; Lacerda de Orio, Roberto ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor Reinforcement learning to reduce failures in SOT-MRAM switchingArtikel Article 2022
64Lenz, Christoph ; Toifl, Alexander ; Quell, Michael ; Rodrigues, Francio ; Hössinger, Andreas ; Weinbub, Josef Curvature Based Feature Detection for Hierarchical Grid Refinement in TCAD Topography SimulationsArtikel Article 2022
65Waltl, Michael ; Knobloch, Theresia ; Tselios, Konstantinos ; Filipovic, Lado ; Stampfer, Bernhard ; Hernandez, Yoanlys ; Waldhör, Dominic ; Illarionov, Yury ; Kaczer, Ben ; Grasser, Tibor Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?Artikel Article 2022
66Wilhelmer, Christoph ; Waldhoer, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem Bellah ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole captureArtikel Article 2022
67Nedjalkov, Mihail ; Ballicchia, Mauro ; Kosik, Robert ; Weinbub, Josef Gauge-Invariant Semidiscrete Wigner TheoryArtikel Article 2022
68Ducry, Fabian ; Waldhoer, Dominic ; Knobloch, Theresia ; Csontos, Miklos ; Jimenez Olalla, Nadia ; Leuthold, Juerg ; Grasser, Tibor ; Luisier, Mathieu An Ab Initio Study on Resistance Switching in Hexagonal Boron NitrideArtikel Article 2022
69Weinbub, Josef ; Ballicchia, Mauro ; Nedjalkov, Mihail Gate-Controlled Electron Quantum Interference LogicArtikel Article 2022
70Knobloch, Theresia ; Selberherr, Siegfried ; Grasser, Tibor Challenges for Nanoscale CMOS Logic Based on Two-Dimensional MaterialsArtikel Article 2022
71Selberherr, Siegfried ; Sverdlov, Viktor About electron transport and spin control in semiconductor devicesArtikel Article 2022
72Aguinsky, Luiz Felipe ; Rodrigues, Frâncio ; Wachter, Georg ; Trupke, Michael ; Schmid, Ulrich ; Hössinger, Andreas ; Weinbub, Josef Phenomenological Modeling of Low-Bias Sulfur Hexafluoride Plasma Etching of SiliconArtikel Article 2022
73Waltl, Michael ; Hernandez, Yoanlys ; Schleich, Christian ; Waschneck, Katja ; Stampfer, Bernhard ; Reisinger, Hans ; Grasser, Tibor Performance Analysis of 4H-SiC Pseudo-D CMOS Inverter Circuits Employing Physical Charge Trapping ModelsArtikel Article 2022
74Fiorentini, Simone ; Ender, Johannes ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor Spin Transfer Torque Evaluation Based on Coupled Spin and Charge Transport: A Finite Element Method ApproachArticle Artikel 2022
75Waltl-2021-Microelectronics Reliability-vor.pdf.jpgWaltl, Michael ; Waldhör, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor Impact of single-defects on the variability of CMOS inverter circuitsArticle Artikel Nov-2021
76Ender-2021-Microelectronics Reliability-vor.pdf.jpgEnder, Johannes ; Lacerda de Orio, Roberto ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, W. ; Sverdlov, Viktor Improving failure rates in pulsed SOT-MRAM switching by reinforcement learningArticle Artikel Nov-2021
77Filipovic-2021-Microelectronics Reliability-vor.pdf.jpgFilipovic, Lado Theoretical examination of thermo-migration in novel platinum microheatersArticle Artikel Aug-2021
78Ansaripour, Iman ; Pourfath, Mahdi Charge-Induced Two-Step Structural Phase Transition in the MoTe₂–WSeTe Hetero-BilayerArticle Artikel 15-Jul-2021
79Abdolhosseini, Saeed ; Boroun, Mohammad ; Pourfath, Mahdi Ab Initio Analysis of Periodic Self-Assembly Phases of Borophene as Anode Material for Na-Ion BatteriesArticle Artikel 18-Mar-2021
80Hernandez, Yoanlys ; Stampfer, Bernhard ; Grasser, Tibor ; Waltl, Michael Impact of Bias Temperature Instabilities on the Performance of Logic Inverter Circuits Using Different SiC Transistor TechnologiesArtikel Article 2021