Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
 
Code Kennzahl
E360
 
Type of Organization Organisationstyp
Institute
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 

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Results 241-260 of 715 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
241Foster, Samuel ; Thesberg, Mischa ; Neophytou, Neophytos Thermoelectric Power Factor of Nanocomposite Materials from Two-Dimensional Quantum Transport SimulationsArtikel Article 2017
242Manstetten, Paul ; Weinbub, Josef ; Hössinger, Andreas ; Selberherr, Siegfried Using Temporary Explicit Meshes for Direct Flux Calculation on Implicit SurfacesArtikel Article2017
243Manstetten, Paul ; Filipovic, Lado ; Hössinger, Andreas ; Weinbub, Josef ; Selberherr, Siegfried Framework to Model Neutral Particle Flux in Convex High Aspect Ratio Structures using One-Dimensional RadiosityArtikel Article 2017
244Šimonka, Vito ; Hössinger, Andreas ; Weinbub, Josef ; Selberherr, Siegfried ReaxFF Reactive Molecular Dynamics Study of Orientation Dependence of Initial Silicon Carbide OxidationArtikel Article 2017
245Šimonka, Vito ; Nawratil, Georg ; Hössinger, Andreas ; Weinbub, Josef ; Selberherr, Siegfried Anisotropic Interpolation Method of Silicon Carbide Oxidation Growth Rates for Three-Dimensional SimulationArtikel Article 2017
246Stradiotto, Roberta ; Pobegen, Gregor ; Ostermaier, Clemens ; Waltl, Michael ; Grill, Alexander ; Grasser, Tibor Characterization of Interface Defects With Distributed Activation Energies in GaN-Based MIS-HEMTsArtikel Article 2017
247Ostermaier, C. ; Lagger, P. ; Prechtl, G. ; Grill, A. ; Grasser, T. ; Pogany, D. Dynamics of Carrier Transport via AlGaN Barrier in AlGaN/GaN MIS-HEMTsArtikel Article 2017
248Rupp Karl - 2016 - A review of recent advances in the spherical harmonics...pdf.jpgRupp, Karl ; Jungemann, C. ; Hong, S.-M. ; Bina, Markus ; Grasser, Tibor ; Jüngel, Ansgar A review of recent advances in the spherical harmonics expansion method for semiconductor device simulationArticle Artikel Sep-2016
249Illarionov, Yury Yu ; Rzepa, Gerhard ; Waltl, Michael ; Knobloch, Theresia ; Grill, Alexander ; Furchi, Marco Mercurio ; Mueller, Thomas ; Grasser, Tibor The role of charge trapping in Mo₂/SiO₂ and MoS₂/hBN field-effect transistorsArtikel Article Sep-2016
250Glaser, Markus ; Kitzler, Andreas ; Johannes, A. ; Prucnal, Slawomir ; Potts, Heidi ; Conesa-Boj, Sonia ; Filipovic, Lidija ; Kosina, Hans ; Skorupa, Wolfgang ; Bertagnolli, Emmerich ; Ronning, C ; Fontcuberta i Morral, Anna ; Lugstein, Alois Synthesis, Morphological, and Electro-optical Characterizations of Metal/Semiconductor Nanowire HeterostructuresArtikel Article 8-Jun-2016
251Wimmer, Yannick ; El-Sayed, Al-Moatasem ; Gös, Wolfgang ; Grasser, Tibor ; Shluger, Alexander L. Role of hydrogen in volatile behaviour of defects in SiO₂-based electronic devicesArtikel Article Jun-2016
252Rescher, Gerald ; Pobegen, Gregor ; Grasser, Tibor Threshold Voltage Instabilities of Present SiC-Power MOSFETs Under Positive Bias Temperature StressArtikel Article2016
253Reiche, Manfred ; Kittler, Martin ; Pippel, Eckhard ; Kosina, Hans ; Lugstein, Alois ; Uebensee, Hartmut Electronic Properties of DislocationsArtikel Article2016
254Ghosh, Joydeep ; Osintsev, Dmitry ; Sverdlov, V. ; Selberherr, Siegfried Enhancement of Electron Spin Relaxation Time in Thin SOI Films by Spin Injection Orientation and Uniaxial StressArtikel Article 2016
255Zeraati, Majid ; Vaez Allaei, S. Mehdi ; Abdolhosseini Sarsari, I. ; Pourfath, Mahdi ; Donadio, Davide Highly Anisotropic Thermal Conductivity of Arsenene: An Ab Initio StudyArtikel Article 2016
256Tyaginov, Stanislav ; Jech, Markus ; Franco, Jacopo ; Sharma, Prateek ; Kaczer, Ben ; Grasser, Tibor Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON n-MOSFETsArtikel Article 2016
257Jech, Markus ; Sharma, Prateek ; Tyaginov, Stanislav ; Rudolf, Florian ; Grasser, Tibor On the Limits of Applicability of Drift-Diffusion Based Hot Carrier Degradation ModelingArtikel Article 2016
258Nazemi, Sanaz ; Pourfath, Mahdi ; Soleimani, Ebrahim Asl ; Kosina, Hans The Effect of Oxide Shell Thickness on the Structural, Electronic, and Optical Properties of Si-SiO₂ Core-Shell Nano-Crystals: A (Time Dependent)Density Functional Theory StudyArtikel Article 2016
259Illarionov, Yury Yu. ; Waltl, Michael ; Smith, Anderson D. ; Vaziri, Sam ; Ostling, Mikael ; Lemme, Max C. ; Grasser, Tibor Bias-Temperature Instability on the Back Gate of Single-Layer Double-Gated Graphene Field-Effect TransistorsArtikel Article 2016
260Rupp, Karl ; Tillet, Philippe ; Rudolf, Florian ; Weinbub, Josef ; Morhammer, Andreas ; Grasser, Tibor ; Jüngel, Ansgar ; Selberherr, Siegfried ViennaCL---Linear Algebra Library for Multi- and Many-Core ArchitecturesArtikel Article 2016