Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
 
Code Kennzahl
E360
 
Type of Organization Organisationstyp
Institute
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 

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Results 301-320 of 715 (Search time: 0.024 seconds).

PreviewAuthor(s)TitleTypeIssue Date
301Azar, Nima Sefidmooye ; Pourfath, Mahdi A Comprehensive Study of Transistors Based on Conductive Polymer Matrix CompositesArtikel Article 2015
302Weinbub, Josef ; Ellinghaus, Paul ; Nedjalkov, Mihail Domain Decomposition Strategies for the Two-Dimensional Wigner Monte Carlo MethodArtikel Article 2015
303Dimov, Ivan ; Nedjalkov, Mihail ; Sellier, Jean-Michel ; Selberherr, Siegfried Boundary Conditions and the Wigner Equation SolutionArtikel Article 2015
304Nedjalkov, Mihail ; Weinbub, Josef ; Ellinghaus, Paul ; Selberherr, Siegfried The Wigner Equation in the Presence of Electromagnetic PotentialsArtikel Article 2015
305Hosseini, Manouchehr ; Elahi, Mohammad ; Pourfath, Mahdi ; Esseni, David Strain-Induced Modulation of Electron Mobility in Single-Layer Transition Metal Dichalcogenides MX₂ ( M = Mo, W ; X = S , Se)Artikel Article 2015
306Hosseini, Manouchehr ; Elahi, Mohammad ; Pourfath, Mahdi ; Esseni, David Strain Induced Mobility Modulation in Single-Layer MoS₂Artikel Article 2015
307Asad, Mohsen ; Salimian, Sedigheh ; Sheikhi, Mohammad Hossein ; Pourfath, Mahdi Flexible Phototransistors Based on Graphene Nanoribbon Decorated with MoS₂ NanoparticlesArtikel Article 2015
308Osintsev, Dmitri ; Sverdlov, Viktor ; Selberherr, Siegfried Electron Mobility and Spin Lifetime Enhancement in Strained Ultra-Thin Silicon FilmsArtikel Article 2015
309Sverdlov, Viktor ; Selberherr, Siegfried Silicon Spintronics: Progress and ChallengesArtikel Article 2015
310Rudolf, Florian ; Rupp, Karl ; Weinbub, Josef ; Morhammer, Andreas ; Selberherr, Siegfried Transformation Invariant Local Element Size SpecificationArtikel Article 2015
311Sharma, P. ; Tyaginov, S. ; Wimmer, Y. ; Rudolf, F. ; Rupp, K. ; Enichlmair, H. ; Park, J.-M. ; Ceric, H. ; Grasser, T. Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETsArtikel Article 2015
312Filipovic, Lado ; Singulani, Anderson Pires ; Roger, Frederic ; Carniello, Sara ; Selberherr, Siegfried Intrinsic Stress Analysis of Tungsten-Lined Open TSVsArtikel Article 2015
313Weinbub, Josef ; Wastl, Matthias ; Rupp, Karl ; Rudolf, Florian ; Selberherr, Siegfried ViennaMaterials - A Dedicated Material Library for Computational Science and EngineeringArtikel Article 2015
314Illarionov, Yury ; Smith, Anderson ; Vaziri, Sam ; Ostling, Mikael ; Mueller, Thomas ; Lemme, Max ; Grasser, Tibor Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and DifferencesArtikel Article2015
315Nazemi, Sanaz ; Pourfath, Mahdi ; Soleimani, Ebrahim Asl ; Kosina, Hans On the Role of Spatial Position of Bridged Oxygen Atoms as Surface Passivants on the Ground-State Gap and Photo-Absorption Spectrum of Silicon Nano-CrystalsArtikel Article2015
316Illarionov, Yury ; Bina, Markus ; Tyaginov, Stanislav ; Rott, Karina ; Kaczer, Ben ; Reisinger, Hans ; Grasser, Tibor Extraction of the Lateral Position of Border Traps in Nanoscale MOSFETsArtikel Article2015
317Kaczer, Ben ; Franco, Jacopo ; Roussel, Philippe J. ; Groeseneken, Guido ; Chiarella, Thomas ; Horiguchi, Naoto ; Grasser, Tibor Extraction of The Random Component of Time-Dependent Variability Using Matched PairsArtikel Article2015
318Palankovski, V. ; Vainshtein, S. ; Yuferev, V. ; Kostamovaara, J. ; Egorkin, V. Effect of Hot-Carrier Energy Relaxation on Main Properties of Collapsing Field Domains in Avalanching GaAsArtikel Article2015
319Hosseini, Manouchehr ; Elahi, Mohammad ; Pourfath, Mahdi ; Esseni, David Very Large Strain Gauges Based on Single Layer MoSe₂ and WSe₂ for Sensing ApplicationsArtikel Article2015
320Axelevitch, A. ; Palankovski, V. ; Selberherr, S. ; Golan, G. Investigation of Novel Silicon PV Cells of a Lateral TypeArtikel Article2015