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| | Preview | Author(s) | Title | Type | Issue Date |
| 141 | | Khan, Sajid ; Shah, Ambika Prasad ; Chouhan, Shailesh Singh ; Gupta, Neha ; Pandey, Jai Gopal ; Vishvakarma, Santosh Kumar | A Symmetric D Flip-Flop Based PUF with Improved Uniqueness | Artikel Article  | 2020 |
| 142 | | Waltl, Michael | Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors | Artikel Article | 2020 |
| 143 | | de Orio, R.L. ; Makarov, A. ; Selberherr, S. ; Goes, W. ; Ender, J. ; Fiorentini, S. ; Sverdlov, V. | Robust Magnetic Field-Free Switching of a Perpendicularly Magnetized Free Layer for SOT-MRAM | Artikel Article | 2020 |
| 144 | | Fiorentini, S. ; de Orio, R. L. ; Selberherr, S. ; Ender, J. ; Goes, W. ; Sverdlov, V. | Analysis of Switching Under Fixed Voltage and Fixed Current in Perpendicular STT-MRAM | Artikel Article | 2020 |
| 145 | | Sverdlov, V. ; El-Sayed, E. A.-M. ; Kosina, H. ; Selberherr, S. | Ballistic Conductance in a Topological 1T '-MoS₂ Nanoribbon | Artikel Article | 2020 |
| 146 | | Feil, Maximilian ; Huerner, Andreas ; Puschkarsky, Katja ; Schleich, Christian ; Eichinger, Thomas ; Gustin, W. ; Reisinger, H. ; Grasser, Tibor | The Impact of Interfacial Charge Trapping on the Reproducibility of Measurements of Silicon Carbide MOSFET Device Parameters | Artikel Article | 2020 |
| 147 | | Waltl, Michael ; Stampfer, Bernhard ; Rzepa, Gerhard ; Kaczer, Ben ; Grasser, Tibor | Separation of Electron and Hole Trapping Components of PBTI in SiON nMOS Transistors | Artikel Article | 2020 |
| 148 | | Ruch, Bernhard ; Pobegen, Gregor ; Grasser, Tibor | Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping | Artikel Article | 2020 |
| 149 | | Khakbaz, Pedram ; Moshayedi, Milad ; Hajian, Sajjad ; Soleimani, Maryam ; Narakathu, Binu Baby ; Bazuin, Bradley ; Pourfath, Mahdi ; Atashbar, Massood | Titanium Carbide MXene as NH₃ Sensor: Realistic First-Principles Study | Article Artikel | 12-Dec-2019 |
| 150 | | Jech, Markus ; El-Sayed, Al-Moatasem Bellah ; Tyaginov, Stanislav ; Shluger, Alexander L. ; Grasser, Tibor | Ab Initio treatment of silicon-hydrogen bond rupture at Si/SiO₂ interfaces | Artikel Article | 15-Nov-2019 |
| 151 | | Medina-Bailon, Christina ; Sadi, Toufik ; Nedjalkov, Mihail ; Carrillo-Nuñez, Hamilton ; Lee, Jaehyun ; Badami, Oves ; Georgiev, Vihar ; Selberherr, Siegfried ; Asenov, Asen | Mobility of Circular and Elliptical Si Nanowire Transistors Using a Multi-Subband 1D Formalism | Artikel Article | Oct-2019 |
| 152 | | Toifl, Alexander ; Simonka, Vito ; Hössinger, Andreas ; Selberherr, Siegfried ; Grasser, Tibor ; Weinbub, Josef | Simulation of the Effects of Postimplantation Annealing on Silicon Carbide DMOSFET Characteristics | Artikel Article | Jul-2019 |
| 153 | | Wu, Zhicheng ; Franco, Jacopo ; Vandooren, Anne ; Kaczer, Ben ; Roussel, Philippe ; Rzepa, Gerhard ; Grasser, Tibor ; Linten, Dimitri ; Groeseneken, Guido | Improved PBTI Reliability in Junction-Less FET Fabricated at Low Thermal Budget for 3-D Sequential Integration | Artikel Article | Jun-2019 |
| 154 | | Boroun, Mohammad ; Abdolhosseini, Saeed ; Pourfath, Mahdi | Separated and intermixed phases of borophene as anode material for lithium-Ion batteries | Article Artikel | 15-Apr-2019 |
| 155 | | Franco, J. ; Wu, Z. ; Rzepa, G. ; Ragnarsson, L.-A. ; Dekkers, H. ; Vandooren, A. ; Groeseneken, G. ; Horiguchi, N. ; Collaert, N. ; Linten, D. ; Grasser, T. ; Kaczer, B. | On the Impact of the Gate Work-Function Metal on the Charge Trapping Component of NBTI and PBTI | Artikel Article | 2019 |
| 156 | | Oliva, Nicolo ; Illarionov, Yury Yu ; Casu, Emanuele A. ; Cavalieri, Matteo ; Knobloch, Theresia ; Grasser, Tibor ; Ionescu, Adrian M. | Hysteresis Dynamics in Double-Gated n-Type WSe₂ FETs With High-k Top Gate Dielectric | Artikel Article | 2019 |
| 157 | | Puschkarsky, K. ; Grasser, T. ; Aichinger, T. ; Gustin, W. ; Reisinger, H. | Review on SiC MOSFETs High-Voltage Device Reliability Focusing on Threshold Voltage Instability | Artikel Article | 2019 |
| 158 | | Ceric, H. ; Zahedmanesh, H. ; Croes, K. | Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods | Artikel Article | 2019 |
| 159 | | Khan, Sajid ; Shah, Ambika Prasad ; Gupta, Neha ; Chouhan, Shailesh Singh ; Pandey, Jai Gopal ; Vishvakarma, Santosh Kumar | An Ultra-Low Power, Reconfigurable, Aging Resilient RO PUF for IoT Applications | Artikel Article | 2019 |
| 160 | | Sanvale, Prachi ; Gupta, Neha ; Neema, Vaibhav ; Shah, Ambika Prasad ; Vishvakarma, Santosh Kumar | An Improved Read-Assist Energy Efficient Single Ended P-P-N Based 10T SRAM Cell for Wireless Sensor Networ | Artikel Article | 2019 |
