Name Card

Full name Familienname, Vorname
Jech, Markus
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 49 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Cvitkovich, Lukas ; Waldhör, Dominic ; El-Sayed, Al-Moatasem ; Jech, Markus ; Wilhelmer, Christoph ; Grasser, Tibor Ab-Initio Modeling of the Initial Stages of Si(100) Thermal OxidationKonferenzbeitrag Inproceedings2022
2Wilhelmer, Christoph ; Waldhör, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab-Initio Study of Multi-State Defects in Amorphous SiO2Konferenzbeitrag Inproceedings2022
3Jech, M. ; Grasser, T. ; Waltl, M. The Importance of Secondary Generated Carriers in Modeling of Full Bias SpaceKonferenzbeitrag Inproceedings 2022
4Milardovich, Diego ; Waldhoer, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem Bellah ; Grasser, Tibor Building Robust Machine Learning Force Fields by Composite Gaussian Approximation PotentialsKonferenzbeitrag Inproceedings 2022
5Milardovich, Diego ; Jech, Markus ; Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Grasser, Tibor Machine Learning Prediction of Defect Structures in Amorphous Silicon DioxideKonferenzbeitrag Inproceedings2022
6Wilhelmer, Christoph ; Waldhoer, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem Bellah ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole captureArtikel Article 2022
7El-Sayed, Al-Moatasem ; Seiler, Heribert ; Kosina, Hans ; Jech, Markus ; Waldhör, Dominic ; Sverdlov, Viktor First Principles Evaluation of Topologically Protected Edge States in MoS$_{2}$ 1T′ Nanoribbons with Realistic TerminationsKonferenzbeitrag Inproceedings 2021
8Jech, Markus ; El-Sayed, Al-Moatasem ; Tyaginov, Stanislav ; Waldhör, Dominic ; Bouakline, Foudhil ; Saalfrank, Peter ; Jabs, Dominic ; Jungemann, Christoph ; Waltl, Michael ; Grasser, Tibor Quantum Chemistry Treatment of Silicon-Hydrogen Bond Rupture by Nonequilibrium Carriers in Semiconductor DevicesArtikel Article 2021
9Franco, J. ; Marneffe, J.-F. ; Vandooren, Anne ; Kimura, Y ; Nyns, L ; Wu, Zhicheng ; El-Sayed, Al-Moatasem ; Jech, Markus ; Waldhör, Dominic ; Claes, Dieter ; Arimura, H ; Ragnarsson, L. A. ; Afanas´Ev, V. ; Horiguchi, N. ; Linten, D ; Grasser, Tibor ; Kaczer, Ben Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO<sub>2</sub> with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier StackingKonferenzbeitrag Inproceedings 2021
10Milardovich, Diego ; Jech, Markus ; Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Grasser, Tibor Machine Learning Prediction of Defect Structures in Amorphous Silicon DioxideKonferenzbeitrag Inproceedings 2021
11Wilhelmer, Christoph ; Jech, Markus ; Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Cvitkovich, Lukas ; Grasser, Tibor Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO<sub>2</sub> NetworkKonferenzbeitrag Inproceedings 2021
12Cvitkovich, Lukas ; Jech, Markus ; Waldhör, Dominic ; El-Sayed, Al-Moatasem ; Wilhelmer, Christoph ; Grasser, Tibor Multiscale Modeling Study of Native Oxide Growth on a Si(100) SurfaceKonferenzbeitrag Inproceedings 2021
13Ruch, Bernhard ; Jech, Markus ; Pobegen, Gregor ; Grasser, Tibor Applicability of Shockley-Read-Hall Theory for Interface StatesArtikel Article 2021
14Jech, Markus ; Rott, Gunnar ; Reisinger, Hans ; Tyaginov, Stanislav ; Rzepa, Gerhard ; Grill, Alexander ; Jabs, Dominic ; Jungemann, Christoph ; Waltl, Michael ; Grasser, Tibor Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space: Implications and PeculiaritiesArtikel Article 8-Aug-2020
15Illarionov, Yury Yu. ; Knobloch, Theresia ; Jech, Markus ; Lanza, Mario ; Akinwande, Deji ; Vexler, Mikhail I. ; Mueller, Thomas ; Lemme, Max C. ; Fiori, Gianluca ; Schwierz, Frank ; Grasser, Tibor Insulators for 2D Nanoelectronics: The Gap to BridgeArtikel Article 2020
16Milardovich, Diego ; Jech, Markus ; Waldhoer, Dominic ; Waltl, Michael ; Grasser, Tibor Machine Learning Prediction of Defect Formation Energies in a-SiO₂Konferenzbeitrag Inproceedings2020
17Vasilev, Alexander ; Jech, Markus ; Grill, Alexander ; Rzepa, Gerhard ; Schleich, Christian ; Makarov, Alexander ; Pobegen, Gregor ; Grasser, Tibor ; Waltl, Michael ; Tyaginov, Stanislav Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC TransistorsKonferenzbeitrag Inproceedings 2020
18Tyaginov, Stanislav ; Grill, Alexander ; Vandemaele, Michiel ; Grasser, Tibor ; Hellings, Geert ; Makarov, Alexander ; Jech, Markus ; Linten, Dimitri ; Kaczer, Ben A Compact Physics Analytical Model for Hot-Carrier DegradationKonferenzbeitrag Inproceedings 2020
19Jech Markus - 2020 - The physics of non-equilibrium reliability phenomena.pdf.jpgJech, Markus The physics of non-equilibrium reliability phenomenaThesis Hochschulschrift 2020
20Ruch, Bernhard ; Jech, Markus ; Pobegen, Gregor ; Grasser, Tibor Applicability of Shockley-Read-Hall Theory for Interface StatesKonferenzbeitrag Inproceedings 2020

Contributing Publications Mitbeteiligte Publikationen

Results 1-1 of 1 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Fleischanderl, Patrick Charakterisierung von Hot Carrier Degradation in SiliziumtransistorenThesis Hochschulschrift2018