Book title Buchtitel
ECS Transactions
 
Publisher Herausgeber
The Electrochemical Society
 
Series Schriftenreihe
ECS Transactions
 

Publications Publikationen

Results 1-20 of 46 (Search time: 0.004 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Palankovski, Vassil ; Kuzmik, Jan ; Garg, R. ; Shenai, K. A Promising New n<sup>++</sup>-GaN/InAlN/GaN HEMT Concept for High-Frequency ApplicationsBuchbeitrag Book Contribution2012
2Wittmann, Robert ; Uppal, Suresh ; Hoessinger, Andreas ; Cervenka, Johann ; Selberherr, Siegfried ; Harame, D. ; Boquet, J. ; Caymax, M. ; Cressler, J. ; Iwai, H. ; Koester, S. ; Masini, G. ; Murota, J. ; Reznicek, A. ; Rim, K. ; Tillack, B. ; Zaima, S. A Study of Boron Implantation into High Ge Content SiGe AlloysBuchbeitrag Book Contribution2006
3Karamitaheri, Hossein ; Pourfath, Mahdi ; Faez, Rahim ; Kosina, Hans ; Karim, Z. ; Misra, D. ; Srinivasan, P. ; Obeng, Y. ; De Gendt, S. An Investigation of the Geometrical Effects on the Thermal Conductivity of Graphene Antidot LatticesBuchbeitrag Book Contribution2011
4Orio, Roberto ; Carniello, Sara ; Ceric, Hajdin ; Selberherr, Siegfried Analysis of Electromigration in Dual-Damascene Interconnect StructuresKonferenzbeitrag Inproceedings2008
5Karlowatz, Gerhard ; Ungersböck, Stephan Enzo ; Wessner, Wilfried ; Kosina, Hans ; Selberherr, Siegfried ; Harame, D. ; Boquet, J. ; Caymax, M. ; Cressler, J. ; Iwai, H. ; Koester, S. ; Masini, G. ; Murota, J. ; Reznicek, A. ; Rim, K. ; Tillack, B. ; Zaima, S. Analysis of Hole Transport in Arbitrarily Strained GermaniumBuchbeitrag Book Contribution2006
6de Orio, R. L. ; Ceric, H. ; Selberherr, Siegfried Analysis of Resistance Change Development Due to Voiding in Copper Interconnects Ended by A Through Silicon ViaKonferenzbeitrag Inproceedings 2012
7Osintsev, Dmitri S. ; Sverdlov, Viktor ; Makarov, Alexander ; Selberherr, Siegfried Ballistic Transport Properties of Spin Field-Effect Transistors Built on Silicon and InAs FinsKonferenzbeitrag Inproceedings 2011
8Wang, Lei ; Merkle, Rotraut ; Baumann, Frank S. ; Fleig, Jürgen ; Maier, Joachim (BaxSr1-x)(CoyFe1-y)O3-δ Perovskites as SOFC Cathode Material: Electrode-Electrolyte Reactions and Electrochemical CharacterisationKonferenzbeitrag Inproceedings2007
9Grasser, Tibor ; Goes, Wolfgang ; Kaczer, Ben ; Ekwal Sah, R. ; Zhang, J. ; Deen, J. ; Yota, J. ; Toriumi, A. Critical Modeling Issues in Negative Bias Temperature InstabilityBuchbeitrag Book Contribution2009
10Palankovski, Vassil ; Donnarumma, Gesualdo ; Kuzmik, Jan ; Garg, R. ; Shenai, K. Degradation Study of Single and Double-Heterojunction InAlN/GaN HEMTs by Two-Dimensional SimulationBuchbeitrag Book Contribution2012
11Karner, Markus ; Gehring, Andreas ; Holzer, Stefan ; Kosina, Hans ; Selberherr, Siegfried ; Kar, S. ; De Gendt, S. ; Houssa, M. ; Landheer, D. ; Misra, D. ; Tsai, W. Efficient Calculation of Lifetime Based Direct Tunneling Through Stacked DielectricsBuchbeitrag Book Contribution2006
12Filipovic, Lado ; Selberherr, Siegfried Electric Field Based Simulations of Local Oxidation Nanolithography Using Atomic Force Microscopy in a Level Set EnvironmentKonferenzbeitrag Inproceedings 2012
13Ceric, Hajdin ; Selberherr, Siegfried Electromigration Modeling for Interconnect Structures in MicroelectronicsKonferenzbeitrag Inproceedings2007
14Kotomin, Eugene A. ; Mastrikov, Yuri ; Heifets, Eugene ; Merkle, Rotraut ; Fleig, Jurgen ; Maier, Joachim ; Gordon, Alexander ; Felsteiner, Joshua First-Principles Modeling of LaMnO3 SOFC Cathode MaterialKonferenzbeitrag Inproceedings2008
15Sverdlov, Viktor ; Baumgartner, Oskar ; Windbacher, Thomas ; Schanovsky, Franz ; Selberherr, Siegfried Impact of Confinement and Stress on the Subband Parameters in Ultra-Thin Silicon FilmsKonferenzbeitrag Inproceedings2009
16Fiorentini, Simone ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Ender, Johannes ; Goes, Wolfgang ; Sverdlov, Viktor ; Martino, J. A. ; Nguyen, B.-Y. ; Gamiz, Francisco ; Ishii, H. ; Raskin, J.-P. ; Selberherr, Siegfried ; Simoen, E. Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAMBuchbeitrag Book Contribution 2020
17Opitz, Alexander K. ; Schintlmeister, Arno ; Hutter, Herbert ; Fleig, Juergen Investigation of the Oxygen Exchange Reaction on Pt/YSZ: The Relation between Three Phase Boundaries and Electrode PerformanceKonferenzbeitrag Inproceedings2009
18Goes, Wolfgang ; Schanovsky, Franz ; Hehenberger, Philipp ; Wagner, Paul-Juergen ; Grasser, Tibor (Invited) Charge Trapping and the Negative Bias Temperature InstabilityBuchbeitrag Book Contribution2010
19Knobloch, Theresia ; Rzepa, Gerhard ; Illarionov, Yury Yuryevich ; Waltl, Michael ; Polyushkin, Dmitry ; Pospischil, Andreas ; Furchi, Marco ; Mueller, Thomas ; Grasser, Tibor ; Misra, D. ; De Gendt, S. ; Houssa, M. ; Kita, K. ; Landheer, D. (Invited) Impact of Gate Dielectrics on the Threshold Voltage in MoS<sub>2</sub>TransistorsBuchbeitrag Book Contribution2017
20Fleig, Jürgen ; Kubicek, Markus ; Huber, Stefanie ; Ahrens, Martin ; Langer-Hansel, Katharina ; Gerstl, Matthias ; Hutter, Herbert ; Mogensen, M. ; Armstrong, T. ; Gur, T. ; Yokokawa, H. ; Zhou, X. (invited) Ion Transfer and Ion Transport in Thin Films Investigated by Complementary Tracer Diffusion and Impedance Spectroscopy MeasurementsKonferenzbeitrag Inproceedings2012