ECS Journal of Solid State Science and Technology

Title Titel
ECS Journal of Solid State Science and Technology
 
e-ISSN
2162-8777
 
ISSN
2162-8769
 
Publisher Herausgeber
ELECTROCHEMICAL SOC INC
 
Publisher's Address Herausgeber Adresse
65 SOUTH MAIN STREET, PENNINGTON, USA, NJ, 08534
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

Results 1-12 of 12 (Search time: 0.006 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Leitgeb, Markus ; Zellner, Christopher ; Schneider, Michael ; Schmid, Ulrich A Combination of Metal Assisted Photochemical and Photoelectrochemical Etching for Tailored Porosification of 4H SiC SubstratesArtikel Article 2016
2Granitzer, P. ; Rumpf, K. ; Coffer, J. ; Poelt, P. ; Reissner, M. Assessment of Magnetic Properties of Nanostructured Silicon Loaded with Superparamagnetic Iron Oxid NanoparticlesArtikel Article2015
3Leitgeb Markus - 2016 - Communication -- The Role of the Metal-Semiconductor...pdf.jpgLeitgeb, Markus ; Backes, Andreas ; Schneider, Michael ; Zellern, Christopher ; Schmid, Ulrich Communication — The Role of the Metal-Semiconductor Junction in Pt-Assisted Photochemical Etching of Silicon CarbideArticle Artikel 2016
4Leitgeb, Markus ; Pfusterschmied, Georg ; Schwarz, Sabine ; Depuydt, Ben ; Cho, Jinyoun ; Schmid, Ulrich Communication-Current Oscillations in Photoelectrochemical Etching of Monocrystalline 4H Silicon CarbideArtikel Article 2021
5Rumpf, K. ; Granitzer, P. ; Koshida, N. ; Poelt, P. ; Michor, H. Morphology Controlled Magnetic Interactions in Metal Embedded Porous Silicon NanostructuresArtikel Article 2015
6Zarate-Galvez-2023-ECS Journal of Solid State Science and Technology-vor.PDF.jpgZarate-Galvez, Sarai ; Garcia-Barrientos, Abel ; Lastras-Martinez, Luis Felipe ; Cardenas-Juarez, Marco ; Macias-Velasquez, Sharon ; Filipovic, Lado ; Arce-Casas, Armando Optimization of Doping Concentration to Obtain High Internal Quantum Efficiency and Wavelength Stability in An InGaN/GaN Blue Light-Emitting DiodeArticle Artikel Jul-2023
7Okorn-Schmidt, Harald F. ; Holsteyns, Frank ; Lippert, Alexander ; Mui, David ; Kawaguchi, Mark ; Lechner, Christiane ; Frommhold, Philipp E. ; Nowak, Till ; Reuter, Fabian ; Piqué, Miquel Banchs ; Cairós, Carlos ; Mettin, Robert Particle Cleaning Technologies to Meet Advanced Semiconductor Device Process RequirementsArtikel Article Jan-2014
8Schwab S - 2017 - Reduction of Sodium Migration in Polymers by Addition of...pdf.jpgSchwab, Stefan ; Jung, J. P. H. ; Appenroth, Julia ; Pittenauer, Ernst ; Allmaier, Günter ; Gruber, Sabine ; Bauer, M. ; Miethaner, Stefan ; Nelhiebel, M. ; Hutter, Herbert Reduction of Sodium Migration in Polymers by Addition of 15-Crown-5 Ether as Getter SubstanceArticle Artikel 2017
9Ceric, H. ; Selberherr, S. ; Zahedmanesh, H. ; de Orio, R. L. ; Croes, K. Review - Modeling Methods for Analysis of Electromigration Degradation in Nano-InterconnectsArtikel Article 2021
10Lutzer, B. ; Hummer, M. ; Simsek, S. ; Zimmermann, C. ; Amsuess, A. ; Hutter, H. ; Detz, H. ; Stoeger-Pollach, M. ; Bethge, O. ; Bertagnolli, E. Rhodium Germanide Schottky Barrier ContactsArtikel Article 2015
11Bohrn, Fabian ; Leitzenberger, Michael ; Schwab, Stefan ; Kügler, Peter Michael ; Brunnbauer, Lukas ; Jordan, Steffen ; Hutter, Herbert Study on the Ion Migration of Silver Ions from Aqueous Solution in Epoxy-Based Molding Compounds by TOF-SIMS MeasurementsArticle Artikel 21-Feb-2022
12Backes, Andreas ; Leitgeb, Markus ; Bittner, Achim ; Schmid, Ulrich Temperature Dependent Pore Formation in Metal Assisted Chemical Etching of SiliconArtikel Article 2016