| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Vasicek, Martin ; Cervenka, Johann ; Esseni, David ; Palestri, Pierpaolo ; Grasser, Tibor | Applicability of Macroscopic Transport Models to Decananometer MOSFETs | Artikel Article | 2012 |
| 2 | | Stradiotto, Roberta ; Pobegen, Gregor ; Ostermaier, Clemens ; Waltl, Michael ; Grill, Alexander ; Grasser, Tibor | Characterization of Interface Defects With Distributed Activation Energies in GaN-Based MIS-HEMTs | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2017 |
| 3 | | Puschkarsky, Katja ; Reisinger, Hans ; Rott, Gunnar Andreas ; Schlünder, Christian ; Gustin, Wolfgang ; Grasser, Tibor | An Efficient Analog Compact NBTI Model for Stress and Recovery Based on Activation Energy Maps | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2019 |
| 4 | | Illarionov, Yury ; Bina, Markus ; Tyaginov, Stanislav ; Rott, Karina ; Kaczer, Ben ; Reisinger, Hans ; Grasser, Tibor | Extraction of the Lateral Position of Border Traps in Nanoscale MOSFETs | Artikel Article | 2015 |
| 5 | | Illarionov, Yury ; Smith, Anderson ; Vaziri, Sam ; Ostling, Mikael ; Mueller, Thomas ; Lemme, Max ; Grasser, Tibor | Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and Differences | Artikel Article | 2015 |
| 6 | | Ullmann, Bianka ; Jech, Markus ; Puschkarsky, Katja ; Rott, Gunnar Andreas ; Waltl, Michael ; Illarionov, Yury ; Reisinger, Hans ; Grasser, Tibor | Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part I: Experimental | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2019 |
| 7 | | Jech, Markus ; Ullmann, Bianka ; Rzepa, Gerhard ; Tyaginov, Stanislav ; Grill, Alexander ; Waltl, Michael ; Jabs, Dominic ; Jungemann, Christoph ; Grasser, Tibor | Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics-Part II: Theory | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2019 |
| 8 | | Sharma, Prateek ; Tyaginov, S. E. ; Wimmer, Yannick ; Rudolf, Florian ; Rupp, Karl ; Bina, Markus ; Enichlmair, H. ; Park, J.M. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor | Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2015 |
| 9 | | Giering, K.-U. ; Puschkarsky, K. ; Reisinger, H. ; Rzepa, G. ; Rott, G. ; Vollertsen, R. ; Grasser, T. ; Jancke, R. | NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2019 |
| 10 | | Grasser, Tibor ; Rott, Karina ; Reisinger, Hans ; Waltl, Michael ; Schanovsky, Franz ; Kaczer, Ben | NBTI in Nanoscale MOSFETs-The Ultimate Modeling Benchmark | Artikel Article | 2014 |
| 11 | | Berens, Judith ; Pobegen, Gregor ; Rescher, Gerald ; Aichinger, Thomas ; Grasser, Tibor | NH₃ and NO + NH₃ Annealing of 4H-SiC Trench MOSFETs: Device Performance and Reliability | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2019 |
| 12 | | Pobegen, Gregor ; Grasser, Tibor | On the Distribution of NBTI Time Constants on a Long, Temperature-Accelerated Time Scale | Artikel Article | 2013 |
| 13 | | Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang ; Reisinger, H. ; Aichinger, T. ; Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Schanovsky, Franz ; Franco, J. ; Toledano-Luque, M. ; Nelhiebel, M. | The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2011 |
| 14 | | Rescher, Gerald ; Pobegen, Gregor ; Aichinger, Thomas ; Grasser, Tibor | Preconditioned BTI on 4H-SiC: Proposal for a Nearly Delay Time-Independent Measurement Technique | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2018 |
| 15 | | Bina, Markus ; Tyaginov, Stanislav ; Franco, Jacopo ; Rupp, Karl ; Wimmer, Yannick ; Osintsev, Dmitry ; Kaczer, Ben ; Grasser, Tibor | Predictive Hot-Carrier Modeling of n-Channel MOSFETs | Artikel Article | 2014 |
| 16 | | Puschkarsky, K. ; Grasser, T. ; Aichinger, T. ; Gustin, W. ; Reisinger, H. | Review on SiC MOSFETs High-Voltage Device Reliability Focusing on Threshold Voltage Instability | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2019 |
| 17 | | Franco, Jacopo ; Kaczer, Ben ; Toledano-Luque, María ; Roussel, Philippe J. ; Kauerauf, Thomas ; Mitard, Jérôme ; Witters, Liesbeth ; Grasser, Tibor ; Groeseneken, Guido | SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices-Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues | Artikel Article | 2013 |
| 18 | | Franco, Jacopo ; Kaczer, Ben ; Roussel, Philippe J. ; Mitard, Jérôme ; Cho, Moonju ; Witters, Liesbeth ; Grasser, Tibor ; Groeseneken, Guido | SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices-Part I: NBTI | Artikel Article | 2013 |
| 19 | | Toifl, Alexander ; Simonka, Vito ; Hössinger, Andreas ; Selberherr, Siegfried ; Grasser, Tibor ; Weinbub, Josef | Simulation of the Effects of Postimplantation Annealing on Silicon Carbide DMOSFET Characteristics | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | Jul-2019 |
| 20 | | Waltl, M. ; Rzepa, G. ; Grill, A. ; Goes, W. ; Franco, J. ; Kaczer, B. ; Witters, L. ; Mitard, J. ; Horiguchi, N. ; Grasser, T. | Superior NBTI in High-k SiGe Transistors - Part I: Experimental | Artikel Article ![peer reviewed](/image/PeerReview_Icon.png) | 2017 |