Name Card

Full name Familienname, Vorname
Grasser, Tibor
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 645 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wilhelmer, Christoph ; Waldhör, Dominic ; Milardovich, Diego ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Electron Trapping in Amorphous Silicon Nitride (a-Si3N4:H)Inproceedings Konferenzbeitrag20-Nov-2023
2Wilhelmer-2023-Nanomaterials-vor.pdf.jpgWilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Milardovich, Diego ; Waltl, Michael ; Grasser, Tibor Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4)Article Artikel Aug-2023
3Wilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab initio investigations of electron and hole trapping processes of H induced defects in amorphous SiO₂Inproceedings Konferenzbeitrag12-Jun-2023
4Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Charge Trapping Sites in Amorphous Si₃N₄Presentation Vortrag30-May-2023
5Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Charged instrinsic defect states in amorphous Si3N4Presentation Vortrag29-May-2023
6Cervenka, Johann ; Kosik, Robert ; Vasicek, Martin-Thomas ; Gritsch, Markus ; Selberherr, Siegfried ; Grasser, Tibor Macroscopic Transport Models for Classical Device SimulationBook Contribution Buchbeitrag2023
7Nazzari, Daniele ; Genser, Jakob Alexander ; Ritter, Viktoria ; Bethge, Ole ; Bertagnolli, Emmerich ; Grasser, Tibor ; Weber, Walter Michael ; Lugstein, Alois Epitaxial growth of crystalline CaF2 on silicene by molecular beam epitaxyPresentation Vortrag12-Sep-2022
8Nazzari, Daniele ; Genser, Jakob Alexander ; Ritter, Viktoria ; Bethge, Ole ; Bertagnolli, Emmerich ; Grasser, Tibor ; Weber, Walter Michael ; Lugstein, Alois Epitaxial growth of crystalline CaF2 on silicene by molecular beam epitaxyPresentation VortragSep-2022
9Nazzari, Daniele ; Genser, Jakob Alexander ; Ritter, Viktoria ; Bethge, Ole ; Bertagnolli, Emmerich ; Grasser, Tibor ; Weber, Walter Michael ; Lugstein, Alois Epitaxial Growth of Crystalline CaF₂ on SiliceneArticle Artikel 20-Jul-2022
10Knobloch, Theresia ; Grasser, Tibor Scalable and Reliable Gate Insulators for 2D Material-Based FETsPräsentation Presentation4-Jul-2022
11Knobloch-2022-Nature Electronics-vor.pdf.jpgKnobloch, Theresia ; Uzlu, Burkay ; Illarionov, Yury ; Wang, Zhenxing ; Otto, Martin ; Filipovic, Lado ; Waltl, Michael ; Neumaier, Daniel ; Lemme, Max Christian ; Grasser, Tibor Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuningArticle Artikel Jun-2022
12Knobloch, Theresia ; Illarionov, Yury ; Grasser, Tibor Enhancing the Stability of 2D Material-Based Transistors via Fermi-Level TuningKonferenzbeitrag Inproceedings2022
13Stephanie, Margareta V. ; Waltl, Michael ; Grasser, Tibor ; Schrenk, Bernhard WDM-Conscious Synaptic Receptor Assisted by SOA+EAMKonferenzbeitrag Inproceedings 2022
14Illarionov, Yury ; Knobloch, Theresia ; Waltl, Michael ; Smets, Q ; Panarella, L ; Kaczer, Ben ; Schram, Tom ; Brems, S ; Cott, D. ; Asselberghs, Inge ; Grasser, Tibor Top Gate Length Dependence of Hysteresis in 300mm FAB MoS2 FETsPräsentation Presentation2022
15Filipovic, Lado ; Grasser, Tibor Special Issue on Miniaturized Transistors, Volume IIArtikel Article2022
16Illarionov, Yury ; Knobloch, Theresia ; Uzlu, B. ; Sokolov, N. S. ; Lemme, Max C ; Grasser, Tibor Highly stable GFETs with 2nm crystalline CaF2 insulatorsPräsentation Presentation2022
17Cvitkovich, Lukas ; Waldhör, Dominic ; El-Sayed, Al-Moatasem ; Jech, Markus ; Wilhelmer, Christoph ; Grasser, Tibor Ab-Initio Modeling of the Initial Stages of Si(100) Thermal OxidationKonferenzbeitrag Inproceedings2022
18Wilhelmer, Christoph ; Waldhör, Dominic ; Jech, Markus ; El-Sayed, Al-Moatasem ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab-Initio Study of Multi-State Defects in Amorphous SiO2Konferenzbeitrag Inproceedings2022
19Illarionov, Yury ; Uzlu, B. ; Knobloch, Theresia ; Banshchikov, A. G. ; Sverdlov, Viktor ; Vexler, M.I. ; Sokolov, N. S. ; Waltl, Michael ; Wang, Z. ; Neumaier, Daniel ; Lemme, M.C. ; Grasser, Tibor CVD-GFETs with Record-small Hysteresis Owing to 2nm Epitaxial CaF2 InsulatorsKonferenzbeitrag Inproceedings2022
20Jech, M. ; Grasser, T. ; Waltl, M. The Importance of Secondary Generated Carriers in Modeling of Full Bias SpaceKonferenzbeitrag Inproceedings 2022

Contributing Publications Mitbeteiligte Publikationen

Results 1-20 of 63 (Search time: 0.001 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Filipovic, Lado ; Grasser, Tibor Miniaturized Transistors, Volume IIBuch BookJun-2022
2Knobloch Theresia - 2022 - On the electrical stability of 2D material-based...pdf.jpgKnobloch, Theresia On the electrical stability of 2D material-based field-effect transistorsThesis Hochschulschrift 2022
3Michl Jakob Daniel - 2022 - Charge trapping and variability in CMOS technologies...pdf.jpgMichl, Jakob Daniel Charge trapping and variability in CMOS technologies at cryogenic temperaturesThesis Hochschulschrift 2022
4Schleich Christian - 2022 - Modeling of defect related reliability phenomena in...pdf.jpgSchleich, Christian Modeling of defect related reliability phenomena in SiC power-MOSFETsThesis Hochschulschrift 2022
5Berens Judith Veronika - 2021 - Carrier mobility and reliability of 4H-SiC...pdf.jpgBerens, Judith Veronika Carrier mobility and reliability of 4H-SiC trench MOSFETsThesis Hochschulschrift 2021
6Ruch Bernhard - 2021 - Hot-carrier degradation in planar and trench Si-MOSFETs.pdf.jpgRuch, Bernhard Hot-carrier degradation in planar and trench Si-MOSFETsThesis Hochschulschrift 2021
7Kratzmann Matthias - 2021 - Development of a low-noise CV measurement module for...pdf.jpgKratzmann, Matthias Development of a low-noise CV measurement module for defect-spectroscopy of MOS transistorsThesis Hochschulschrift 2021
8Weger Magdalena - 2021 - Electric characterization of SiC Trench MOSFETs with...pdf.jpgWeger, Magdalena Electric characterization of SiC Trench MOSFETs with DLTS and admittance spectroscopyThesis Hochschulschrift 2021
9Grasser, Tibor Noise in Nanoscale Semiconductor DevicesBuch Book2020
10Waschneck Katja Anna - 2020 - Modeling Bias temperature instability in Si and...pdf.jpgWaschneck, Katja Anna Modeling Bias temperature instability in Si and SiC MOSFETs using activation energy mapsThesis Hochschulschrift 2020
11Stampfer Bernhard - 2020 - Advanced electrical characterization of charge...pdf.jpgStampfer, Bernhard Advanced electrical characterization of charge trapping in MOS transistorsThesis Hochschulschrift 2020
12Jech Markus - 2020 - The physics of non-equilibrium reliability phenomena.pdf.jpgJech, Markus The physics of non-equilibrium reliability phenomenaThesis Hochschulschrift 2020
13Sharma Prateek - 2020 - Predictive and efficient modeling of hot carrier...pdf.jpgSharma, Prateek Predictive and efficient modeling of hot carrier degradation with drift-diffusion based carrier transport modelsThesis Hochschulschrift 2020
14Stampfer, Bernhard ; Grill, Alexander ; Waltl, Michael Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise SignalsBuchbeitrag Book Contribution 2020
15Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Wimmer, Yannick ; Waltl, Michael ; Grasser, Tibor Atomistic Modeling of Oxide DefectsBuchbeitrag Book Contribution 2020
16Schleich, Christian Charakterisierung und Modellierung von SiC TransistorenThesis Hochschulschrift2019
17Klemenschits, Xaver ; Selberherr, Siegfried ; Filipovic, Lado Modeling of Gate Stack Patterning for Advanced Technology Nodes: A ReviewBuchbeitrag Book Contribution 2019
18Filipovic, Lado ; Grasser, Tibor Miniaturized TransistorsBuch Book2019
19Gnam, Lukas ; Manstetten, Paul ; Hössinger, Andreas ; Selberherr, Siegfried ; Weinbub, Josef Accelerating Flux Calculations Using Sparse SamplingBuchbeitrag Book Contribution 2019
20Fleischanderl, Patrick Charakterisierung von Hot Carrier Degradation in SiliziumtransistorenThesis Hochschulschrift2018