Name Card

Full name Familienname, Vorname
Grasser, Tibor
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 652 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Sokolovic, Igor ; Rasouli, Saeed ; Wu, Bing ; Sofer, Zdeněk ; Matković, Aleksandar ; Schmid, Michael ; Diebold, Ulrike ; Grasser, Tibor PtSe₂ vdW single-crystal surfaces studied at the atomic scale with ncAFMPresentation Vortrag19-Mar-2024
2Wilhelmer, Christoph ; Waldhör, Dominic ; Milardovich, Diego ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Electron Trapping in Amorphous Silicon Nitride (a-Si3N4:H)Inproceedings Konferenzbeitrag20-Nov-2023
3Tselios, Konstantinos ; Knobloch, Theresia ; Waldhör, Dominic ; Stampfer, Bernhard ; Ioannidis , Eleftherios ; Enichlmair , Hubert ; Minixhofer , Rainer ; Grasser, Tibor ; Waltl, Michael Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂ TransistorsArticle Artikel Sep-2023
4Mounir-2023-Solid-State Electronics-vor.pdf.jpgMounir, Ahmed ; Iniguez, Benjamin ; Lime, Francois ; Kloes, Alexander ; Knobloch, Theresia ; Grasser, Tibor Compact I-V Model for back-gated and double-gated TMD FETsArticle Artikel Sep-2023
5Wilhelmer-2023-Nanomaterials-vor.pdf.jpgWilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Milardovich, Diego ; Waltl, Michael ; Grasser, Tibor Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4)Article Artikel Aug-2023
6Ravichandran, Harikrishnan ; Knobloch, Theresia ; Pannone, Andrew ; Karl, Alexander ; Stampfer, Bernhard ; Waldhör, Dominic ; Zheng, Yikai ; Sakib, Najam ; Karim Sadaf, Muhatsim ; Pendurthi, Rahul ; Torsi, Riccardo ; Robinson, Joshua A. ; Grasser, Tibor ; Das, Saptarshi Observation of Rich Defect Dynamics in Monolayer MoS₂Article Artikel 25-Jul-2023
7Wilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Ab initio investigations of electron and hole trapping processes of H induced defects in amorphous SiO₂Inproceedings Konferenzbeitrag12-Jun-2023
8Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Charge Trapping Sites in Amorphous Si₃N₄Presentation Vortrag30-May-2023
9Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Charged instrinsic defect states in amorphous Si3N4Presentation Vortrag29-May-2023
10Knobloch, Theresia ; Grasser, Tibor Gate Stack Design for Field-Effect Transistors Based on Two-Dimensional MaterialsInproceedings Konferenzbeitrag 28-May-2023
11Knobloch, Theresia ; Selberherr, Siegfried ; Grasser, Tibor High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI CircuitsInproceedings Konferenzbeitrag28-May-2023
12Knobloch, Theresia ; Selberherr, Siegfried ; Grasser, Tibor High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI CircuitsArticle Artikel 19-May-2023
13Cervenka, Johann ; Kosik, Robert ; Vasicek, Martin-Thomas ; Gritsch, Markus ; Selberherr, Siegfried ; Grasser, Tibor Macroscopic Transport Models for Classical Device SimulationBook Contribution Buchbeitrag2023
14Tselios, Konstantinos ; Knobloch, Theresia ; Michl, Jakob Daniel ; Waldhör, Dominic ; Schleich, Christian ; Ioannidis , Eleftherios ; Enichlmair , Hubert ; Minixhofer , Rainer ; Grasser, Tibor ; Waltl, Michael Impact of Single Defects on NBTI and PBTI Recovery in SiO₂ TransistorsInproceedings Konferenzbeitrag Oct-2022
15Nazzari, Daniele ; Genser, Jakob Alexander ; Ritter, Viktoria ; Bethge, Ole ; Bertagnolli, Emmerich ; Grasser, Tibor ; Weber, Walter Michael ; Lugstein, Alois Epitaxial growth of crystalline CaF2 on silicene by molecular beam epitaxyPresentation Vortrag12-Sep-2022
16Nazzari, Daniele ; Genser, Jakob Alexander ; Ritter, Viktoria ; Bethge, Ole ; Bertagnolli, Emmerich ; Grasser, Tibor ; Weber, Walter Michael ; Lugstein, Alois Epitaxial growth of crystalline CaF2 on silicene by molecular beam epitaxyPresentation VortragSep-2022
17Nazzari, Daniele ; Genser, Jakob Alexander ; Ritter, Viktoria ; Bethge, Ole ; Bertagnolli, Emmerich ; Grasser, Tibor ; Weber, Walter Michael ; Lugstein, Alois Epitaxial Growth of Crystalline CaF₂ on SiliceneArticle Artikel 20-Jul-2022
18Knobloch, Theresia ; Grasser, Tibor Scalable and Reliable Gate Insulators for 2D Material-Based FETsPräsentation Presentation4-Jul-2022
19Knobloch-2022-Nature Electronics-vor.pdf.jpgKnobloch, Theresia ; Uzlu, Burkay ; Illarionov, Yury ; Wang, Zhenxing ; Otto, Martin ; Filipovic, Lado ; Waltl, Michael ; Neumaier, Daniel ; Lemme, Max Christian ; Grasser, Tibor Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuningArticle Artikel Jun-2022
20Filipovic, Lado ; Grasser, Tibor Special Issue on Miniaturized Transistors, Volume IIArtikel Article2022

Contributing Publications Mitbeteiligte Publikationen

Results 1-20 of 63 (Search time: 0.019 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Filipovic, Lado ; Grasser, Tibor Miniaturized Transistors, Volume IIBuch BookJun-2022
2Knobloch Theresia - 2022 - On the electrical stability of 2D material-based...pdf.jpgKnobloch, Theresia On the electrical stability of 2D material-based field-effect transistorsThesis Hochschulschrift 2022
3Schleich Christian - 2022 - Modeling of defect related reliability phenomena in...pdf.jpgSchleich, Christian Modeling of defect related reliability phenomena in SiC power-MOSFETsThesis Hochschulschrift 2022
4Michl Jakob Daniel - 2022 - Charge trapping and variability in CMOS technologies...pdf.jpgMichl, Jakob Daniel Charge trapping and variability in CMOS technologies at cryogenic temperaturesThesis Hochschulschrift 2022
5Berens Judith Veronika - 2021 - Carrier mobility and reliability of 4H-SiC...pdf.jpgBerens, Judith Veronika Carrier mobility and reliability of 4H-SiC trench MOSFETsThesis Hochschulschrift 2021
6Ruch Bernhard - 2021 - Hot-carrier degradation in planar and trench Si-MOSFETs.pdf.jpgRuch, Bernhard Hot-carrier degradation in planar and trench Si-MOSFETsThesis Hochschulschrift 2021
7Kratzmann Matthias - 2021 - Development of a low-noise CV measurement module for...pdf.jpgKratzmann, Matthias Development of a low-noise CV measurement module for defect-spectroscopy of MOS transistorsThesis Hochschulschrift 2021
8Weger Magdalena - 2021 - Electric characterization of SiC Trench MOSFETs with...pdf.jpgWeger, Magdalena Electric characterization of SiC Trench MOSFETs with DLTS and admittance spectroscopyThesis Hochschulschrift 2021
9Grasser, Tibor Noise in Nanoscale Semiconductor DevicesBuch Book2020
10Waschneck Katja Anna - 2020 - Modeling Bias temperature instability in Si and...pdf.jpgWaschneck, Katja Anna Modeling Bias temperature instability in Si and SiC MOSFETs using activation energy mapsThesis Hochschulschrift 2020
11Stampfer Bernhard - 2020 - Advanced electrical characterization of charge...pdf.jpgStampfer, Bernhard Advanced electrical characterization of charge trapping in MOS transistorsThesis Hochschulschrift 2020
12Jech Markus - 2020 - The physics of non-equilibrium reliability phenomena.pdf.jpgJech, Markus The physics of non-equilibrium reliability phenomenaThesis Hochschulschrift 2020
13Sharma Prateek - 2020 - Predictive and efficient modeling of hot carrier...pdf.jpgSharma, Prateek Predictive and efficient modeling of hot carrier degradation with drift-diffusion based carrier transport modelsThesis Hochschulschrift 2020
14Stampfer, Bernhard ; Grill, Alexander ; Waltl, Michael Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise SignalsBuchbeitrag Book Contribution 2020
15Waldhoer, Dominic ; El-Sayed, Al-Moatasem Bellah ; Wimmer, Yannick ; Waltl, Michael ; Grasser, Tibor Atomistic Modeling of Oxide DefectsBuchbeitrag Book Contribution 2020
16Schleich, Christian Charakterisierung und Modellierung von SiC TransistorenThesis Hochschulschrift2019
17Klemenschits, Xaver ; Selberherr, Siegfried ; Filipovic, Lado Modeling of Gate Stack Patterning for Advanced Technology Nodes: A ReviewBuchbeitrag Book Contribution 2019
18Filipovic, Lado ; Grasser, Tibor Miniaturized TransistorsBuch Book2019
19Gnam, Lukas ; Manstetten, Paul ; Hössinger, Andreas ; Selberherr, Siegfried ; Weinbub, Josef Accelerating Flux Calculations Using Sparse SamplingBuchbeitrag Book Contribution 2019
20Fleischanderl, Patrick Charakterisierung von Hot Carrier Degradation in SiliziumtransistorenThesis Hochschulschrift2018